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NTHL025N065SC1 PDF预览

NTHL025N065SC1

更新时间: 2023-09-03 20:35:54
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
8页 298K
描述
Silicon Carbide (SiC) MOSFET - EliteSiC, 19 mohm, 650 V, M2, TO-247-3L

NTHL025N065SC1 数据手册

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DATA SHEET  
www.onsemi.com  
Silicon Carbide (SiC)  
MOSFET – EliteSiC,  
19ꢀmohm,ꢀ650ꢀV, M2,  
TO-247-3L  
V
R
MAX  
I MAX  
D
(BR)DSS  
DS(ON)  
650 V  
28.5 m@ 18 V  
99 A  
D
NTHL025N065SC1  
Features  
G
Typ. R  
= 19 m@ V = 18 V  
GS  
= 25 m@ V = 15 V  
GS  
DS(on)  
Typ. R  
DS(on)  
Ultra Low Gate Charge (Q  
= 164 nC)  
Low Capacitance (C = 278 pF)  
G(tot)  
S
NCHANNEL MOSFET  
oss  
100% Avalanche Tested  
T = 175°C  
J
This Device is Halide Free and RoHS Compliant with exemption 7a,  
PbFree 2LI (on second level interconnection)  
Typical Applications  
G
D
SMPS (Switching Mode Power Supplies)  
Solar Inverters  
UPS (Uninterruptable Power Supplies)  
Energy Storages  
TO2473LD  
CASE 340CX  
MARKING DIAGRAM  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
Parameter  
DraintoSource Voltage  
Symbol  
Value  
650  
Unit  
V
V
DSS  
GatetoSource Voltage  
V
8/+22  
5/+18  
V
GS  
HL025N  
065SC1  
AYWWZZ  
Recommended Operation Values  
of GatetoSource Voltage  
T
< 175°C  
= 25°C  
V
GSop  
V
C
Continuous Drain  
Current (Note 1)  
Steady  
State  
T
I
99  
348  
70  
A
W
A
C
D
Power Dissipation  
(Note 1)  
P
D
Continuous Drain  
Current (Note 1)  
Steady  
State  
T
C
= 100°C  
I
D
HL025N065SC1 = Specific Device Code  
A
Y
= Assembly Location  
= Year  
Power Dissipation  
(Note 1)  
P
174  
323  
W
A
D
WW = Work Week  
ZZ  
Pulsed Drain Current  
(Note 2)  
T
C
= 25°C  
I
DM  
= Lot Traceability  
Operating Junction and Storage Temperature  
Range  
T , T  
55 to  
°C  
J
stg  
+175  
ORDERING INFORMATION  
Source Current (Body Diode)  
I
S
75  
62  
A
Device  
NTHL025N065SC1  
Package  
Shipping  
Single Pulse DraintoSource Avalanche  
E
AS  
mJ  
Energy (I  
= 11.2 A, L = 1 mH) (Note 3)  
TO2473LD 30 Units /  
L(pk)  
Tube  
Maximum Lead Temperature for Soldering  
(1/8from case for 5 s)  
T
L
260  
°C  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1. The entire application environment impacts the thermal resistance values shown,  
they are not constants and are only valid for the particular conditions noted.  
2. Repetitive rating, limited by max junction temperature.  
3. E of 62 mJ is based on starting T = 25°C; L = 1 mH, I = 11.2 A,  
AS  
DD  
J
AS  
V
= 50 V, V = 18 V.  
GS  
© Semiconductor Components Industries, LLC, 2021  
1
Publication Order Number:  
January, 2023 Rev. 2  
NTHL025N065SC1/D  
 

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