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NM27P512QE200 PDF预览

NM27P512QE200

更新时间: 2024-02-27 22:44:17
品牌 Logo 应用领域
美国国家半导体 - NSC 存储内存集成电路可编程只读存储器电动程控只读存储器
页数 文件大小 规格书
12页 178K
描述
524,288-Bit (64K x 8) Processor Oriented CMOS EPROM

NM27P512QE200 技术参数

是否Rohs认证:不符合生命周期:Obsolete
包装说明:WDIP, DIP28,.6Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.61
风险等级:5.44Is Samacsys:N
最长访问时间:200 nsI/O 类型:COMMON
JESD-30 代码:R-GDIP-T28JESD-609代码:e0
内存密度:524288 bit内存集成电路类型:UVPROM
内存宽度:8功能数量:1
端子数量:28字数:65536 words
字数代码:64000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:64KX8输出特性:3-STATE
封装主体材料:CERAMIC, GLASS-SEALED封装代码:WDIP
封装等效代码:DIP28,.6封装形状:RECTANGULAR
封装形式:IN-LINE, WINDOW并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:5 V
认证状态:Not Qualified最大待机电流:0.0001 A
子类别:EPROMs最大压摆率:0.04 mA
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIEDBase Number Matches:1

NM27P512QE200 数据手册

 浏览型号NM27P512QE200的Datasheet PDF文件第4页浏览型号NM27P512QE200的Datasheet PDF文件第5页浏览型号NM27P512QE200的Datasheet PDF文件第6页浏览型号NM27P512QE200的Datasheet PDF文件第8页浏览型号NM27P512QE200的Datasheet PDF文件第9页浏览型号NM27P512QE200的Datasheet PDF文件第10页 
Functional Description  
DEVICE OPERATION  
This assures that all deselected memory devices are in their  
low power standby modes and that the output pins are ac-  
tive only when data is desired from a particular memory de-  
vice.  
The six modes of operation of the EPROM are listed in Ta-  
ble I. It should be noted that all inputs for the six modes are  
at TTL levels. The power supplies required are V  
CC  
and  
OE/V . The OE/V power supply must be at 12.75V dur-  
PP PP  
ing the three programming modes, and must be at 5V in the  
Programming  
CAUTION: Exceeding 14V on pin 22 (OE/V ) will damage  
PP  
the EPROM.  
other three modes. The V power supply must be at 6.25V  
CC  
during the three programming modes, and at 5V in the other  
three modes.  
Initially, and after each erasure, all bits of the EPROM are in  
the ‘‘1’s’’ state. Data is introduced by selectively program-  
ming ‘‘0’s’’ into the desired bit locations. Although only  
‘‘0’s’’ will be programmed, both ‘‘1’s’’ and ‘‘0’s’’ can be pre-  
sented in the data word. The only way to change a ‘‘0’’ to a  
‘‘1’’ is by ultraviolet light erasure.  
Read Mode  
The EPROM has two control functions, both of which must  
be logically active in order to obtain data at the outputs.  
Chip Enable (CE/PGM) is the power control and should be  
The EPROM is in the programming mode when the OE/V  
PP  
used for device selection. Output Enable (OE/V ) is the  
PP  
is at 12.75V. It is required that at least a 0.1 mF capacitor be  
output control and should be used to gate data to the output  
pins, independent of device selection. Assuming that ad-  
placed across V  
CC  
to ground to suppress spurious voltage  
transients which may damage the device. The data to be  
programmed is applied 8 bits in parallel to the data output  
pins. The levels required for the address and data inputs are  
TTL.  
dresses are stable, address access time (t  
) is equal to  
ACC  
the delay from CE to output (t ). Data is available at the  
CE  
outputs t  
after the falling edge of OE, assuming that CE  
OE  
has been low and addresses have been stable for at least  
–t  
t
.
ACC OE  
When the address and data are stable, an active low, TTL  
program pulse is applied to the CE/PGM input. A program  
pulse must be applied at each address location to be pro-  
grammed.  
Standby Mode  
The EPROM has a standby mode which reduces the active  
power dissipation by over 99%, from 385 mW to 0.55 mW.  
The EPROM is placed in the standby mode by applying a  
CMOS high signal to the CE/PGM input. When in standby  
mode, the outputs are in a high impedance state, indepen-  
dent of the OE input.  
The EPROM is programmed with the Fast Programming Al-  
gorithm shown in Figure 1. Each Address is programmed  
with a series of 100 ms pulses until it verifies good, up to a  
maximum of 25 pulses. Most memory cells will program with  
a single 100 ms pulse.  
Output Disable  
The EPROM must not be programmed with a DC signal ap-  
plied to the CE/PGM input.  
The EPROM is placed in output disable by applying a TTL  
high signal to the OE input. When in output disable all cir-  
cuitry is enabled, except the outputs are in a high imped-  
ance state (TRI-STATE).  
Programming multiple EPROM in parallel with the same  
data can be easily accomplished due to the simplicity of  
the programming requirements. Like inputs of the parallel  
EPROM may be connected together when they are pro-  
grammed with the same data. A low level TTL pulse applied  
to the CE/PGM input programs the paralleled EPROM.  
Output OR-Typing  
Because the EPROM is usually used in larger memory ar-  
rays, National has provided a 2-line control function that  
accommodates this use of multiple memory connections.  
The 2-line control function allows for:  
Program Inhibit  
Programming multiple EPROMs in parallel with different  
data is also easily accomplished. Except for CE/PGM all  
a) the lowest possible memory power dissipation, and  
like inputs (including OE/V ) of the parallel EPROMs may  
PP  
be common. A TTL low level program pulse applied to an  
b) complete assurance that output bus contention will not  
occur.  
EPROM’s CE/PGM input with OE/V at 12.75V will pro-  
PP  
gram that EPROM. A TTL high level CE/PGM input inhibits  
the other EPROMs from being programmed.  
To most efficiently use these two control lines, it is recom-  
mended that CE/PGM be decoded and used as the primary  
device selecting function, while OE/V  
be made a com-  
PP  
mon connection to all devices in the array and connected to  
the READ line from the system control bus.  
7

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