MP4209
TOSHIBA Power MOS FET Module Silicon N Channel MOS Type (Four L2-π-MOSV in One)
MP4209
High Power, High Speed Switching Applications
Industrial Applications
Unit: mm
For Printer Head Pin Driver and Pulse Motor Driver
For Solenoid Driver
•
•
•
4-V gate drivability
Small package by full molding (SIP 10 pins)
High drain power dissipation (4-device operation)
: P = 4 W (Ta = 25°C)
T
•
•
•
Low drain-source ON resistance: R
= 0.28 Ω (typ.)
DS (ON)
High forward transfer admittance: |Y | = 3.5 S (typ.)
fs
Low leakage current: I
I
= ±10 μA (max) (V
= 100 μA (max) (V
= ±16 V)
= 100 V)
GSS
GS
DSS
DS
•
Enhancement-mode: V = 0.8 to 2.0 V (V
= 10 V, I = 1 mA)
DS D
th
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Drain-source voltage
Symbol
Rating
Unit
V
100
100
±20
3
V
V
V
DSS
JEDEC
JEITA
―
―
Drain-gate voltage (R
Gate-source voltage
= 20 kΩ)
V
GS
DGR
V
GSS
TOSHIBA
2-25A1C
DC
I
D
Drain current
A
Weight: 2.1 g (typ.)
Pulse
I
12
DP
Drain power dissipation
(1-device operation, Ta = 25°C)
P
2.0
4.0
W
W
D
Drain power dissipation
(4device operation, Ta = 25°C)
P
E
DT
Single pulse avalanche energy
140
3
mJ
A
AS
AR
(Note 1)
Avalanche current
I
- device
operation
E
0.2
AR
Repetitive avalanche
mJ
energy
(Note 2)
4device
operation
E
0.4
ART
Channel temperature
T
150
°C
°C
ch
Storage temperature range
T
stg
−55 to 150
Note 1: Condition for avalanche energy (single pulse) measurement
= 50 V, starting T = 25°C, L = 20 mH, R = 25 Ω, I = 3 A
AR
V
DD
ch
G
Note 2: Repetitive rating; pulse width limited by maximum channel temperature
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Please handle with caution.
1
2006-10-27