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MP4209_07 PDF预览

MP4209_07

更新时间: 2024-11-12 04:14:51
品牌 Logo 应用领域
东芝 - TOSHIBA 驱动器开关脉冲
页数 文件大小 规格书
7页 173K
描述
High Power, High Speed Switching Applications For Printer Head Pin Driver and Pulse Motor Driver For Solenoid Driver

MP4209_07 数据手册

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MP4209  
TOSHIBA Power MOS FET Module Silicon N Channel MOS Type (Four L2-π-MOSV in One)  
MP4209  
High Power, High Speed Switching Applications  
Industrial Applications  
Unit: mm  
For Printer Head Pin Driver and Pulse Motor Driver  
For Solenoid Driver  
4-V gate drivability  
Small package by full molding (SIP 10 pins)  
High drain power dissipation (4-device operation)  
: P = 4 W (Ta = 25°C)  
T
Low drain-source ON resistance: R  
= 0.28 (typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 3.5 S (typ.)  
fs  
Low leakage current: I  
I
= ±10 μA (max) (V  
= 100 μA (max) (V  
= ±16 V)  
= 100 V)  
GSS  
GS  
DSS  
DS  
Enhancement-mode: V = 0.8 to 2.0 V (V  
= 10 V, I = 1 mA)  
DS D  
th  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
100  
100  
±20  
3
V
V
V
DSS  
JEDEC  
JEITA  
Drain-gate voltage (R  
Gate-source voltage  
= 20 k)  
V
GS  
DGR  
V
GSS  
TOSHIBA  
2-25A1C  
DC  
I
D
Drain current  
A
Weight: 2.1 g (typ.)  
Pulse  
I
12  
DP  
Drain power dissipation  
(1-device operation, Ta = 25°C)  
P
2.0  
4.0  
W
W
D
Drain power dissipation  
(4device operation, Ta = 25°C)  
P
E
DT  
Single pulse avalanche energy  
140  
3
mJ  
A
AS  
AR  
(Note 1)  
Avalanche current  
I
- device  
operation  
E
0.2  
AR  
Repetitive avalanche  
mJ  
energy  
(Note 2)  
4device  
operation  
E
0.4  
ART  
Channel temperature  
T
150  
°C  
°C  
ch  
Storage temperature range  
T
stg  
55 to 150  
Note 1: Condition for avalanche energy (single pulse) measurement  
= 50 V, starting T = 25°C, L = 20 mH, R = 25 , I = 3 A  
AR  
V
DD  
ch  
G
Note 2: Repetitive rating; pulse width limited by maximum channel temperature  
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
This transistor is an electrostatic-sensitive device. Please handle with caution.  
1
2006-10-27  

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