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MJD112_06

更新时间： 2024-11-04 03:49:15
品牌 Logo 应用领域
安森美 - ONSEMI 晶体晶体管
页数 文件大小 规格书
8页 102K
描述
Complementary Darlington Power Transistors

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MJD112_06 数据手册

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MJD112 (NPN)  
MJD117 (PNP)  
Preferred Device  
Complementary Darlington  
Power Transistors  
DPAK For Surface Mount Applications  
http://onsemi.com  
Designed for general purpose power and switching such as output or  
driver stages in applications such as switching regulators, converters,  
and power amplifiers.  
SILICON  
POWER TRANSISTORS  
2 AMPERES  
Features  
• Lead Formed for Surface Mount Applications in Plastic Sleeves  
(No Suffix)  
100 VOLTS, 20 WATTS  
• Straight Lead Version in Plastic Sleeves (“−1” Suffix)  
• Electrically Similar to Popular TIP31 and TIP32 Series  
• Pb−Free Packages are Available  
MARKING  
DIAGRAMS  
4
YWW  
J11xG  
MAXIMUM RATINGS  
2
1
3
Rating  
Symbol  
Max  
Unit  
DPAK  
Collector−Emitter Voltage  
V
100  
Vdc  
CASE 369C  
CEO  
Collector−Base Voltage  
Emitter−Base Voltage  
V
V
100  
5
Vdc  
Vdc  
Adc  
CB  
EB  
4
I
2
4
Collector Current − Continuous  
− Peak  
C
B
YWW  
J11xG  
Base Current  
I
50  
mAdc  
1
P
20  
0.16  
W
W/°C  
Total Power Dissipation @ T = 25°C  
D
C
2
Derate above 25°C  
3
DPAK−3  
CASE 369D  
Total Power Dissipation (Note1)  
P
W
W/°C  
D
1.75  
0.014  
@ T = 25°C  
A
Derate above 25°C  
Y
WW  
x
= Year  
= Work Week  
= 2 or 7  
Operating and Storage Junction  
Temperature Range  
T , T  
−65 to +150  
°C  
J
stg  
G
= Pb−Free Package  
THERMAL CHARACTERISTICS  
Characteristic  
Symbol  
Max  
6.25  
71.4  
Unit  
°C/W  
°C/W  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 6 of this data sheet.  
Thermal Resistance, Junction−to−Case  
R
q
JC  
Thermal Resistance, Junction−to−Ambient  
(Note 1)  
R
q
JA  
Maximum ratings are those values beyond which device damage can occur.  
Maximum ratings applied to the device are individual stress limit values (not  
normal operating conditions) and are not valid simultaneously. If these limits are  
exceeded, device functional operation is not implied, damage may occur and  
reliability may be affected.  
Preferred devices are recommended choices for future use  
and best overall value.  
1. These ratings are applicable when surface mounted on the minimum pad  
sizes recommended.  
©
Semiconductor Components Industries, LLC, 2006  
1
Publication Order Number:  
January, 2006 − Rev. 7  
MJD112/D  
 
12345678

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