Ordering number : EN7192B
LA6581T
Monolithic Linear IC
Fan Motor Driver
http://onsemi.com
BTL Driver Single-Phase Full-Wave
Overview
The LA6581T is a low-saturation BTL output linear driving motor driver for single-phase bipolar fan motors. It
features quite, low power, high efficiency drive that suppresses reactive current. It is optimal for use in applications that
require miniaturization and low noise, such as CPU cooling fan motors and 5 to 12V electronic game products.
Functions
• Single-phase full-wave linear drive with BTL output (gain resistance 500Ω to 284kΩ, 55dB) : Suitable for the
equipment requiring silent operation, such as game equipment, CPU cooler, etc. because of its freedom from
switching noise.
• Low-voltage operation possible, with wide operable voltage range (3 to 16V)
• Low saturation output (Upper + lower saturation voltage : V sat (total) = 0.3V typ, I = 100mA) : High coil
O
O
efficiency with low current drain. IC itself does not generate much heat.
• High impedance of Hall input pin
• FG output (rotation speed detection output : open collector output)
• Heat protection circuit : When the large current flows because of output short-circuit, raising the IC chip temperature
above 180°C, the heat protection circuit suppresses the drive current, preventing IC burn and breakdown.
• Ultraminiature package (MSOP8: 3.0mm×4.9mm×0.93mm typ) : Small substrate while allowing larger blades.
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
V
Supply voltage
Output current
V
I
max
18
CC
max
max
0.30
A
OUT
Output withstand voltage
FG output withstand
V
V
I
18
18
V
OUT
max
V
FG
max
FG output current
5
mA
mW
°C
°C
FG
Allowable power dissipation
Operating temperature
Storage temperature
Pd max
Topr
400
-20 to +90
-55 to +150
Tstg
* Specified board: 20.0mm × 10.1mm × 0.8mm, Paper phenol, wiring density 20%.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
May, 2013
30409 MS / 60607 MS IM B8-5218 / N2502AS (OT) No.7192-1/4