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JANTX2N4033 PDF预览

JANTX2N4033

更新时间: 2024-11-27 12:33:47
品牌 Logo 应用领域
安森美 - ONSEMI 晶体开关小信号双极晶体管
页数 文件大小 规格书
4页 105K
描述
Small Signal Switching Transistor

JANTX2N4033 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BCY包装说明:CYLINDRICAL, O-MBCY-W3
针数:2Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8541.21.00.95
风险等级:5.24Is Samacsys:N
最大集电极电流 (IC):1 A集电极-发射极最大电压:80 V
配置:SINGLE最小直流电流增益 (hFE):25
JEDEC-95代码:TO-205ADJESD-30 代码:O-MBCY-W3
元件数量:1端子数量:3
最高工作温度:200 °C最低工作温度:-65 °C
封装主体材料:METAL封装形状:ROUND
封装形式:CYLINDRICAL极性/信道类型:PNP
最大功率耗散 (Abs):0.8 W认证状态:Not Qualified
参考标准:MIL子类别:Other Transistors
表面贴装:NO端子形式:WIRE
端子位置:BOTTOM晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):150 MHz
最大关闭时间(toff):25 ns最大开启时间(吨):15 ns
Base Number Matches:1

JANTX2N4033 数据手册

 浏览型号JANTX2N4033的Datasheet PDF文件第2页浏览型号JANTX2N4033的Datasheet PDF文件第3页浏览型号JANTX2N4033的Datasheet PDF文件第4页 
2N4029, 2N4033  
Product Preview  
Small Signal Switching  
Transistor  
PNP Silicon  
http://onsemi.com  
Features  
COLLECTOR  
3
MILPRF19500/512Qualified  
Available as JAN, JANTX, and JANTXV  
2
BASE  
MAXIMUM RATINGS  
Rating  
CollectorEmitter Voltage  
CollectorBase Voltage  
EmitterBase Voltage  
Symbol  
Value  
80  
80  
5.0  
1
Unit  
Vdc  
Vdc  
Vdc  
Adc  
W
1
EMITTER  
V
CEO  
V
CBO  
V
EBO  
Collector Current Continuous  
I
C
Total Device Dissipation @ T = 25°C  
P
A
T
T
2N4029  
2N4033  
0.5  
0.8  
Total Device Dissipation @ T = 25°C  
P
W
TO18  
CASE 206AA  
STYLE 1  
TO39  
CASE 205AB  
STYLE 1  
C
2N4029  
2N4033  
1.0  
4.0  
2N4029  
2N4033  
Operating and Storage Junction  
Temperature Range  
T , T  
65 to +200  
°C  
J
stg  
THERMAL CHARACTERISTICS  
Characteristic  
ORDERING INFORMATION  
Symbol  
Max  
Unit  
Level  
JAN  
Device  
Package Shipping  
Thermal Resistance, JunctiontoAmbient  
R
°C/W  
q
JA  
2N4029  
2N4033  
325  
195  
2N4029  
TO18  
TO39  
Bulk  
Bulk  
JANTX  
Thermal Resistance, JunctiontoCase  
R
°C/W  
q
JC  
2N4033  
2N4029  
2N4033  
150  
40  
JANTXV  
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
Recommended Operating Conditions may affect device reliability.  
This document contains information on a product under development. ON Semiconductor  
reserves the right to change or discontinue this product without notice.  
© Semiconductor Components Industries, LLC, 2013  
1
Publication Order Number:  
March, 2013 Rev. P0  
2N4029/D  

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