®
Lead-
ee
ispLSI 2128VE
Fr
Packag
Options
ailable!
e
3.3V In-System Programmable
SuperFAST™ High Density PLD
Av
Features
Functional Block Diagram*
• SuperFAST HIGH DENSITY IN-SYSTEM
PROGRAMMABLE LOGIC
— 6000 PLD Gates
Output Routing Pool (ORP)
D7 D6
D5
D4
Output Routing Pool (ORP)
D2
D1
D0
D3
— 128 and 64 I/O Pin Versions, Eight Dedicated Inputs
— 128 Registers
— High Speed Global Interconnect
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
— 100% Functional, JEDEC and Pinout Compatible
with ispLSI 2128V Devices
A0
A1
C7
C6
D
Q
Q
Q
Q
A2
A3
C5
C4
D
D
D
Logic
Array
A4
A5
C3
C2
GLB
• 3.3V LOW VOLTAGE 2128 ARCHITECTURE
— Interfaces with Standard 5V TTL Devices
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
— fmax = 250MHz Maximum Operating Frequency
— tpd = 4.0ns Propagation Delay
A6
A7
C1
C0
Global Routing Pool (GRP)
— Electrically Erasable and Reprogrammable
— Non-Volatile
B0
B1
B2
B3
B5
B6
B7
B4
Output Routing Pool (ORP)
Output Routing Pool (ORP)
— 100% Tested at Time of Manufacture
— Unused Product Term Shutdown Saves Power
0139A/2128VE
*128 I/O Version Shown
• IN-SYSTEM PROGRAMMABLE
— 3.3V In-System Programmability (ISP™) Using
Boundary Scan Test Access Port (TAP)
Description
The ispLSI 2128VE is a High Density Programmable
Logic Device available in 128 and 64 I/O-pin versions.
The device contains 128 Registers, eight Dedicated
Input pins, three Dedicated Clock Input pins, two dedi-
cated Global OE input pins and a Global Routing Pool
(GRP). The GRP provides complete interconnectivity
between all of these elements. The ispLSI 2128VE
features in-system programmability through the Bound-
ary Scan Test Access Port (TAP) and is 100% IEEE
1149.1 Boundary Scan Testable. The ispLSI 2128VE
offers non-volatile reprogrammability of the logic, as well
as the interconnect to provide truly reconfigurable sys-
tems.
— Open-Drain Output Option for Flexible Bus Interface
Capability, Allowing Easy Implementation of Wired-
OR Bus Arbitration Logic
— Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE
• THE EASE OF USE AND FAST SYSTEM SPEED OF
PLDs WITH THE DENSITY AND FLEXIBILITY OF FPGAS
— Enhanced Pin Locking Capability
— Three Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
Interconnectivity
The basic unit of logic on the ispLSI 2128VE device is the
Generic Logic Block (GLB). The GLBs are labeled A0, A1
.. D7 (see Figure 1). There are a total of 32 GLBs in the
ispLSI 2128VE device. Each GLB is made up of four
macrocells. Each GLB has 18 inputs, a programmable
AND/OR/ExclusiveORarray, andfouroutputswhichcan
be configured to be either combinatorial or registered.
Inputs to the GLB come from the GRP and dedicated
inputs. All of the GLB outputs are brought back into the
GRP so that they can be connected to the inputs of any
GLB on the device.
• LEAD-FREE PACKAGE OPTIONS
Copyright©2004LatticeSemiconductorCorp. Allbrandorproductnamesaretrademarksorregisteredtrademarksoftheirrespectiveholders. Thespecificationsandinformationhereinaresubject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
August 2004
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