Datasheet > ISL73041SEH

ISL73041SEH

更新时间： 2024-03-03 10:10:51

品牌	Logo	应用领域
瑞萨 - RENESAS		/
页数	文件大小	规格书
40页	1628K
描述
Radiation Hardened 12V Half Bridge GaN FET Driver

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ISL73041SEH 数据手册

ISL73041SEH Datasheet

10. Ordering Information

Radiation Hardness

(Total Ionizing Dose)

Package Description

(RoHS Compliant)

Package

Drawing

Carrier

Type

[1]

Part Number

Temp Range

16 Pad CLCC Packaged

Device (QML-V Level

Screening)

ISL73041SEHML

J16.A

Tray

LDR to 75krad(Si)

Bare Die (QML-V Level

Screening)

[2]

ISL73041SEHMX

N/A

Tray

-55 to +125°C

[2][3]

ISL73041SEHX/SAMPLE

Die

N/A

16 Pad CLCC Packaged

Device

[3]

ISL73041SEHL/PROTO

J16.A

[4]

ISL73041SEHEV1Z

ISL73041SEH Evaluation Board

[4]

ISL73847SEHEV2Z

ISL73847SEH + ISL73041SEH Evaluation Board

ISL73847SEH + ISL73041SEH Business Card Size Demonstration board with Package GaN

FETs; V = 12V; V = 1V; I = 50A; f = 500kHz;

[4]

ISL73847SEHDEMO2Z

OUT

1. These Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with

both SnPb and Pb-free soldering operations.

2. Die product tested at T_A= + 25°C. The wafer probe test includes functional and parametric testing sufficient to make the die capable of

meeting the electrical performance outlined in Electrical Specifications. The die is sourced from wafer lots that have been qualified for

Group C and Group E per MIL-PRF-38535 (Refer to R34TB0001: Renesas Radiation Hardened QML-V Equivalent Screening and QCI

Flow for more information).

3. The /PROTO and /SAMPLE are not rated or certified for Total Ionizing Dose (TID) or Single Event Effect (SEE) immunity. These parts

are intended for engineering evaluation purposes only. The /PROTO parts meet the electrical limits and conditions across temperature

specified in this datasheet. The /SAMPLE parts are capable of meeting the electrical limits and conditions specified in this datasheet. The

/SAMPLE parts do not receive 100% screening across temperature to the electrical limits. These part types do not come with a Certificate

of Conformance.

4. Evaluation board uses the /PROTO parts and /PROTO parts are not rated or certified for Total Ionizing Dose (TID) or Single Event Effect

(SEE) immunity.

11. Revision History

Rev.

Date

Description

Updated Features bullets.

1.03

Jan 4, 2024

Added Dual Complimentary Low-Side GaN FET Driver section.

Updated Figure 14.

1.02

Jun 22, 2023

Updated Ordering Information table.

R34DS0017EU0103 Rev.1.03

Jan 4, 2024

Page 38

1...35 36 373839 40

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