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IS61WV102416DALL-10BLI PDF预览

IS61WV102416DALL-10BLI

更新时间: 2022-09-29 19:18:39
品牌 Logo 应用领域
美国芯成 - ISSI 静态存储器
页数 文件大小 规格书
17页 628K
描述
IC SRAM 16M PARALLEL 48MGA

IS61WV102416DALL-10BLI 数据手册

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IS61/64WV102416DALL  
IS61/64WV102416DBLL  
FUNCTION DESCRIPTION  
SRAM is one of random access memories. Each byte or word has an address and can be accessed randomly. SRAM  
has three different modes supported. Each function is described below with Truth Table.  
STANDBY MODE  
Device enters standby mode when deselected (CS# HIGH). The input and output pins (I/O0-15) are placed in a high  
impedance state. CMOS input in this mode will maximize saving power.  
WRITE MODE  
Write operation issues with Chip selected (CS#) and Write Enable (WE#) input LOW. The input and output pins (I/O0-  
15) are in data input mode. Output buffers are closed during this time even if OE# is LOW. UB# and LB# enables a  
byte write feature. By enabling LB# LOW, data from I/O pins (I/O0 through I/O7) are written into the location specified  
on the address pins. And with UB# being LOW, data from I/O pins (I/O8 through I/O15) are written into the location.  
READ MODE  
Read operation issues with Chip selected (CS# LOW) and Write Enable (WE#) input HIGH. When OE# is LOW, output  
buffer turns on to make data output. Any input to I/O pins during READ mode is not permitted. UB# and LB# enables a  
byte read feature. By enabling LB# LOW, data from memory appears on I/O0-7. And with UB# being LOW, data from  
memory appears on I/O8-15.  
In the READ mode, output buffers can be turned off by pulling OE# HIGH. In this mode, internal device operates as  
READ but I/Os are in a high impedance state. Since device is in READ mode, active current is used.  
POWER UP INITIALIZATION  
The device includes on-chip voltage sensor used to launch POWER-UP initialization process.  
When VDD reaches stable level, the device requires 150us of tPU (Power-Up Time) to complete its self-initialization  
process.  
When initialization is complete, the device is ready for normal operation.  
tPU 150 us  
Stable VDD  
VDD  
Device Initialization  
Device for Normal Operation  
0V  
TRUTH TABLE  
Mode  
CS#  
WE#  
OE#  
LB#  
UB#  
I/O0-I/O7  
I/O8-I/O15 VDD Current  
Not Selected  
H
L
L
L
L
L
L
L
L
X
H
H
H
H
H
L
X
H
H
L
L
L
X
X
X
X
L
H
L
H
L
L
X
L
L
H
L
L
H
L
L
High-Z  
High-Z  
High-Z  
DOUT  
High-Z  
DOUT  
DIN  
High-Z  
High-Z  
High-Z  
High-Z  
DOUT  
DOUT  
High-Z  
DIN  
ISB1, ISB2  
Output Disabled  
ICC  
Read  
ICC  
ICC  
Write  
L
L
H
L
High-Z  
DIN  
DIN  
Integrated Silicon Solution, Inc.- www.issi.com  
3
Rev. A2  
08/07/2019  

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