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IS61DDPB24M18B1 PDF预览

IS61DDPB24M18B1

更新时间: 2024-11-22 01:01:31
品牌 Logo 应用领域
美国芯成 - ISSI /
页数 文件大小 规格书
31页 887K
描述
Fixed 2-bit burst for read and write operations

IS61DDPB24M18B1 数据手册

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IS61DDPB24M18B/B1/B2  
IS61DDPB22M36B/B1/B2  
4Mx18, 2Mx36  
NOVEMBER 2014  
72Mb DDR-IIP(Burst 2) CIO SYNCHRONOUS SRAM  
(2.5 Cycle Read Latency)  
FEATURES  
DESCRIPTION  
The 72Mb IS61DDPB22M36B/B1/B2 and  
2Mx36 and 4Mx18 configuration available.  
IS61DDPB24M18B/B1/B2 are synchronous, high-  
performance CMOS static random access memory (SRAM)  
devices. These SRAMs have a common I/O bus. The rising  
edge of K clock initiates the read/write operation, and all  
internal operations are self-timed. Refer to the Timing  
Reference Diagram for Truth Table for a description of the  
basic operations of these DDR-IIP (Burst of 2) CIO SRAMs.  
On-chip Delay-Locked Loop (DLL) for wide data  
valid window.  
Common I/O read and write ports.  
Synchronous pipeline read with self-timed late write  
operation.  
Double Data Rate (DDR) interface for read and  
write input ports.  
Read and write addresses are registered on alternating rising  
edges of the K clock. Reads and writes are performed in  
double data rate.  
2.5 cycle read latency.  
Fixed 2-bit burst for read and write operations.  
Clock stop support.  
The following are registered internally on the rising edge of  
the K clock:  
Two input clocks (K and K#) for address and control  
registering at rising edges only.  
Read/write address  
Two echo clocks (CQ and CQ#) that are delivered  
simultaneously with data.  
Read enable  
+1.8V core power supply and 1.5, 1.8V VDDQ, used  
with 0.75, 0.9V VREF.  
Write enable  
Byte writes  
HSTL input and output interface.  
Data-in for first burst addresses  
Data-Out for second burst addresses  
Registered addresses, write and read controls, byte  
writes, data in, and data outputs.  
The following are registered on the rising edge of the K#  
clock:  
Full data coherency.  
Byte writes  
Boundary scan using limited set of JTAG 1149.1  
functions.  
Data-in for second burst addresses  
Data-Out for first burst addresses  
Byte write capability.  
Fine ball grid array (FBGA) package:  
13mm x 15mm & 15mm x 17mm body size  
165-ball (11 x 15) array  
Byte writes can change with the corresponding data-in to  
enable or disable writes on a per-byte basis. An internal write  
buffer enables the data-ins to be registered one cycle after  
the write address. The first data-in burst is clocked one cycle  
later than the write command signal, and the second burst is  
timed to the following rising edge of the K# clock.  
Programmable impedance output drivers via 5x  
user-supplied precision resistor.  
Data Valid Pin (QVLD).  
ODT (On Die Termination) feature is supported  
optionally on data input, K/K#, and BWx#.  
During the burst read operation, the data-outs from the first  
bursts are updated from output registers of the third rising  
edge of the K# clock (starting two and half cycles later after  
read command). The data-outs from the second burst are  
updated with the fourth rising edge of the K clock where read  
command receives at the first rising edge of K.  
The end of top mark (B/B1/B2) is to define options.  
IS61DDPB22M36B : Don’t care ODT function and  
pin connection  
IS61DDPB22M36B1 : Option1  
IS61DDPB22M36B2 : Option2  
Refer to more detail description at page 6 for each  
ODT option.  
The device is operated with a single +1.8V power supply and  
is compatible with HSTL I/O interfaces.  
Copyright © 2014 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can  
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such  
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:  
a.) the risk of injury or damage has been minimized;  
b.) the user assume all such risks; and  
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. A  
1
09/11/2014  

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