5秒后页面跳转
IDT71V35761SA166BGG8 PDF预览

IDT71V35761SA166BGG8

更新时间: 2024-02-20 10:14:05
品牌 Logo 应用领域
艾迪悌 - IDT 静态存储器内存集成电路
页数 文件大小 规格书
21页 324K
描述
Cache SRAM, 128KX36, 3.5ns, CMOS, PBGA119, GREEN, BGA-119

IDT71V35761SA166BGG8 技术参数

生命周期:Active零件包装代码:BGA
包装说明:BGA,针数:119
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.22
最长访问时间:3.5 ns其他特性:PIPELINED ARCHITECTURE
JESD-30 代码:R-PBGA-B119JESD-609代码:e1
长度:22 mm内存密度:4718592 bit
内存集成电路类型:CACHE SRAM内存宽度:36
功能数量:1端子数量:119
字数:131072 words字数代码:128000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:128KX36
封装主体材料:PLASTIC/EPOXY封装代码:BGA
封装形状:RECTANGULAR封装形式:GRID ARRAY
并行/串行:PARALLEL认证状态:Not Qualified
座面最大高度:2.36 mm最大供电电压 (Vsup):3.465 V
最小供电电压 (Vsup):3.135 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:TIN SILVER COPPER
端子形式:BALL端子节距:1.27 mm
端子位置:BOTTOM宽度:14 mm
Base Number Matches:1

IDT71V35761SA166BGG8 数据手册

 浏览型号IDT71V35761SA166BGG8的Datasheet PDF文件第2页浏览型号IDT71V35761SA166BGG8的Datasheet PDF文件第3页浏览型号IDT71V35761SA166BGG8的Datasheet PDF文件第4页浏览型号IDT71V35761SA166BGG8的Datasheet PDF文件第5页浏览型号IDT71V35761SA166BGG8的Datasheet PDF文件第6页浏览型号IDT71V35761SA166BGG8的Datasheet PDF文件第7页 
128K x 36  
IDT71V35761YS/S  
IDT71V35761YSA/SA  
3.3VSynchronousSRAMs  
3.3VI/O,PipelinedOutputs  
BurstCounter,SingleCycleDeselect  
Features  
Description  
128K x 36 memory configurations  
The IDT71V35761 are high-speed SRAMs organized as  
Supports high system speed:  
128Kx36.TheIDT71V35761SRAMscontainwrite,data,addressand  
controlregisters. InternallogicallowstheSRAMtogenerateaself-timed  
writebaseduponadecisionwhichcanbeleftuntiltheendofthewritecycle.  
Theburstmodefeatureoffersthehighestlevelofperformancetothe  
systemdesigner,astheIDT71V35761canprovidefourcyclesofdatafor  
a single address presented to the SRAM. An internal burst address  
counteracceptsthefirstcycleaddressfromtheprocessor,initiatingthe  
Commercial:  
– 200MHz 3.1ns clock access time  
CommercialandIndustrial:  
– 183MHz 3.3ns clock access time  
– 166MHz 3.5ns clock access time  
LBO input selects interleaved or linear burst mode  
Self-timedwritecyclewithglobalwritecontrol(GW),bytewrite accesssequence.Thefirstcycleofoutputdatawillbepipelinedforone  
enable (BWE), and byte writes (BWx)  
3.3V core power supply  
Power down controlled by ZZ input  
3.3V I/O  
Optional - Boundary Scan JTAG Interface (IEEE 1149.1 andthe LBO inputpin.  
compliant)  
cycle before it is available on the next rising clock edge. If burst mode  
operationisselected(ADV=LOW),thesubsequentthreecyclesofoutput  
datawillbeavailabletotheuseronthenextthreerisingclockedges. The  
orderofthesethreeaddressesaredefinedbytheinternalburstcounter  
The IDT71V35761 SRAMs utilize IDT’s latest high-performance  
Packaged in a JEDEC Standard 100-pin plastic thin quad CMOSprocessandarepackagedinaJEDECstandard14mmx20mm  
flatpack(TQFP),119ballgridarray(BGA)and165finepitchball 100-pin thinplasticquadflatpack(TQFP)aswellasa119ballgridarray  
grid array  
(BGA) and 165 fine pitch ball grid array.  
PinDescriptionSummary  
A0-A17  
Address Inputs  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Output  
Input  
Input  
I/O  
Synchronous  
Synchronous  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Synchronous  
N/A  
Chip Enable  
CE  
CS  
0
, CS  
1
Chip Selects  
Output Enable  
OE  
GW  
Global Write Enable  
Byte Write Enable  
Individual Byte Write Selects  
Clock  
BWE  
BW , BW  
(1)  
1
2
, BW  
3
, BW  
4
CLK  
Burst Address Advance  
Address Status (Cache Controller)  
Address Status (Processor)  
Linear / Interleaved Burst Order  
Test Mode Select  
Test Data Input  
Synchronous  
Synchronous  
Synchronous  
DC  
ADV  
ADSC  
ADSP  
LBO  
TMS  
TDI  
Synchronous  
Synchronous  
N/A  
TCK  
TDO  
TRST  
ZZ  
Test Clock  
Test Data Output  
Synchronous  
Asynchronous  
Asynchronous  
Synchronous  
N/A  
JTAG Reset (Optional)  
Sleep Mode  
I/O  
0
-I/O31, I/OP1-I/OP4  
DD, VDDQ  
SS  
Data Input / Output  
Core Power, I/O Power  
Ground  
V
Supply  
Supply  
V
N/A  
5301 tbl 01  
MAY 2010  
1
©2010IntegratedDeviceTechnology,Inc.  
DSC-5301/05  

IDT71V35761SA166BGG8 替代型号

型号 品牌 替代类型 描述 数据表
IDT71V35761SA166BG8 IDT

功能相似

Cache SRAM, 128KX36, 3.5ns, CMOS, PBGA119, BGA-119
IDT71V35761SA166BG IDT

功能相似

128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Sin

与IDT71V35761SA166BGG8相关器件

型号 品牌 获取价格 描述 数据表
IDT71V35761SA166BGGI IDT

获取价格

3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V35761SA166BGGI8 IDT

获取价格

3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V35761SA166BGI IDT

获取价格

128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Sin
IDT71V35761SA166BGI8 IDT

获取价格

Cache SRAM, 128KX36, 3.5ns, CMOS, PBGA119, BGA-119
IDT71V35761SA166BQ IDT

获取价格

128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Sin
IDT71V35761SA166BQG IDT

获取价格

Cache SRAM, 128KX36, 3.5ns, CMOS, PBGA165, GREEN, FBGA-165
IDT71V35761SA166BQG8 IDT

获取价格

3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V35761SA166BQGI IDT

获取价格

3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V35761SA166BQGI8 IDT

获取价格

3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V35761SA166BQI IDT

获取价格

128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Sin