Reliability Test (Wire Wound Chip Inductors
Specification
Test Method
0402HC、0603UC、0805UC、
0805UF、1008IF、1210IF、
Item
1008UC、1210HC
1812IF
1
2
3
Operating Temperature Range
Storage Temperature Range
Rating current
-40~+125℃
-40~+125℃
-40~+85℃
-40~+85℃
200~1360mA(max)
40~600mA (max)
(current sources):33010D
(Test Frequency):0.252~250MHz
(Test Equpment):HP4291A、 HP4286A、HP4287A、HP4284A
(Test Fixture):16193A or 16334A
4
Inductance
1.0~8600nH
16~65(min)
1.2~1000 µH
8~30 (min)
(Test Frequency):0.252~1500MHz
(Test Equpment):HP4291A、HP4286A、HP4287A
(Test Fixture):16193A 16334A
5
Q
6
7
RDC
SRF
0.030~9.000Ω(max)
0.22~22.5 (max)
1.4~350MHz(min)
(Test Equpment):HP4263B
(Test Equpment):HP4291A
(Test Fixture):16193A
40~12500MHz(min)
(Soldering Temp.):230±5℃
(Dippng time):5±1S
8
Solderability
The metalized area must have more then 90% of solder coverage
No evidence of mechanical damage 75%
The metalized area must have more then 75% of solder coverage
±5%。Inductance change less than±5%
(Soldering Temp.):260±5℃
(Dippng time):10±1S
9
Resistance to Soldering heat
Q ±10%。Q change less than ±10%
(A cycle contain):
(Step 1):-40℃,30Min
(Step 2):85℃,30Min
(Cycle Times):10
。No evidence of mechanical damage
±5%。Inductance change less than±5%
Q ±10%。Q change less than ±10%
10
Tehermal Shock
(Test Temperature):
125±2℃( ceramic core)
85±2℃( Ferrite core)
(Test Time):96±2 小时
。No evidence of mechanical damage
±5%。Inductance change less than±5%
Q ±10%。Q change less than ±10%
High Temperature
Storage
11
12
13
。No evidence of mechanical damage
±5%。Inductance change less than±5%
Q ±10%。Q change less than ±10%
(Test Temperature):
-40±2℃
Low Temperature
Storage
(Test Time):96±2Hours
Test Temperature):50±2℃
(Test Time):96±2 小时
90~95%
。No evidence of mechanical damage
±5%。Inductance change less than±5%
Q ±10%。Q change less than ±10%
Static Humidity
(with rating current)
。No evidence of mechanical damage
±5%。Inductance change less than±5%
Q ±10%。Q change less than ±10%
。
(Amplitude):1.5mm
X、Y、Z 1 45
14
15
Vibration
(Frequency range):10~55~10Hz(min)
(Force):4 Lbs
Component Adhesion
Noevidence of peel off or broken
(Test Time);10S
(camber ):20mm
(Test Board): (Glass-Epoxy board)
(Thickness ):0.8mm
16
17
No evidence of mechanical damage
Resistance to Bend
(Test Temperature):85±2℃
(Test Time):1000Hours
(With rating current)
Life
Inductor shall not have a shorted or openwinding
Note: Electrical Characteristic are to be tested after 24±2 hours at standard (room) conditions.
Inductors
15191 Bledsoe St., Sylmar, CA 91342
Tel (818) 364-9800 • Fax (818) 364-6100
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