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FDD2572_F085_08 PDF预览

FDD2572_F085_08

更新时间: 2024-11-18 12:00:07
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飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
11页 578K
描述
N-Channel PowerTrench® MOSFET 150V, 29A, 54mΩ

FDD2572_F085_08 数据手册

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November 2008  
FDD2572_F085  
N-Channel PowerTrench® MOSFET  
150V, 29A, 54mΩ  
Features  
Applications  
rDS(ON) = 45m(Typ.), VGS = 10V, ID = 9A  
Qg(tot) = 26nC (Typ.), VGS = 10V  
Low Miller Charge  
DC/DC converters and Off-Line UPS  
Distributed Power Architectures and VRMs  
Primary Switch for 24V and 48V Systems  
High Voltage Synchronous Rectifier  
Direct Injection / Diesel Injection Systems  
42V Automotive Load Control  
Low QRR Body Diode  
UIS Capability (Single Pulse and Repetitive Pulse)  
Qualified to AEC Q101  
RoHS Compliant  
Formerly developmental type 82860  
Electronic Valve Train Systems  
DRAIN  
(FLANGE)  
D
GATE  
G
SOURCE  
TO-252AA  
FDD SERIES  
S
MOSFET Maximum Ratings TC = 25°C unless otherwise noted  
Symbol  
VDSS  
VGS  
Parameter  
Ratings  
150  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current  
V
V
±20  
Continuous (TC = 25oC, VGS = 10V)  
Continuous (TC = 100oC, VGS = 10V)  
Continuous (Tamb = 25oC, VGS = 10V, RθJA = 52oC/W)  
Pulsed  
29  
20  
A
A
ID  
4
Figure 4  
36  
A
mJ  
EAS  
Single Pulse Avalanche Energy (Note 1)  
Power dissipation  
Derate above 25oC  
135  
W
PD  
0.9  
W/oC  
oC  
TJ, TSTG  
Operating and Storage Temperature  
-55 to 175  
Thermal Characteristics  
RθJC  
RθJA  
RθJA  
Thermal Resistance Junction to Case TO-252  
1.11  
100  
52  
oC/W  
oC/W  
oC/W  
Thermal Resistance Junction to Ambient TO-252  
Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area  
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a  
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/  
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.  
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems  
certification.  
©2008 Fairchild Semiconductor Corporation  
1
www.fairchildsemi.com  
FDD2572_F085 Rev.A  

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