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FDD2572_SB82094 PDF预览

FDD2572_SB82094

更新时间: 2024-11-18 20:08:27
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
11页 247K
描述
Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET

FDD2572_SB82094 技术参数

是否Rohs认证: 符合生命周期:Obsolete
Reach Compliance Code:not_compliant风险等级:5.84
配置:Single最大漏极电流 (Abs) (ID):29 A
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-609代码:e3
湿度敏感等级:1工作模式:ENHANCEMENT MODE
最高工作温度:175 °C极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):135 W子类别:FET General Purpose Power
表面贴装:YES端子面层:Matte Tin (Sn)
Base Number Matches:1

FDD2572_SB82094 数据手册

 浏览型号FDD2572_SB82094的Datasheet PDF文件第2页浏览型号FDD2572_SB82094的Datasheet PDF文件第3页浏览型号FDD2572_SB82094的Datasheet PDF文件第4页浏览型号FDD2572_SB82094的Datasheet PDF文件第5页浏览型号FDD2572_SB82094的Datasheet PDF文件第6页浏览型号FDD2572_SB82094的Datasheet PDF文件第7页 
September 2002  
FDD2572 / FDU2572  
N-Channel PowerTrench® MOSFET  
150V, 29A, 54mΩ  
Features  
Applications  
rDS(ON) = 45m(Typ.), VGS = 10V, ID = 9A  
Qg(tot) = 26nC (Typ.), VGS = 10V  
Low Miller Charge  
DC/DC converters and Off-Line UPS  
Distributed Power Architectures and VRMs  
Primary Switch for 24V and 48V Systems  
High Voltage Synchronous Rectifier  
Direct Injection / Diesel Injection Systems  
42V Automotive Load Control  
Low QRR Body Diode  
UIS Capability (Single Pulse and Repetitive Pulse)  
Qualified to AEC Q101  
Formerly developmental type 82860  
Electronic Valve Train Systems  
DRAIN  
(FLANGE)  
D
SOURCE  
DRAIN  
DRAIN  
(FLANGE)  
GATE  
GATE  
G
SOURCE  
TO-252AA  
FDD SERIES  
TO-251AA  
FDU SERIES  
S
MOSFET Maximum Ratings TC = 25°C unless otherwise noted  
Symbol  
VDSS  
VGS  
Parameter  
Ratings  
150  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current  
V
V
±20  
Continuous (TC = 25oC, VGS = 10V)  
Continuous (TC = 100oC, VGS = 10V)  
Continuous (Tamb = 25oC, VGS = 10V, RθJA = 52oC/W)  
Pulsed  
29  
20  
A
A
ID  
4
Figure 4  
36  
A
mJ  
EAS  
Single Pulse Avalanche Energy (Note 1)  
Power dissipation  
Derate above 25oC  
135  
W
PD  
0.9  
W/oC  
oC  
TJ, TSTG  
Operating and Storage Temperature  
-55 to 175  
Thermal Characteristics  
RθJC  
RθJA  
RθJA  
Thermal Resistance Junction to Case TO-251, TO-252  
1.11  
100  
52  
oC/W  
oC/W  
oC/W  
Thermal Resistance Junction to Ambient TO-251, TO-252  
Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area  
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a  
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/  
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.  
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems  
certification.  
©2002 Fairchild Semiconductor Corporation  
FDD2572 / FDU2572 Rev. B  

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