Datasheet > EP20K200CB356C8N

EP20K200CB356C8N

更新时间： 2024-11-08 08:37:43

品牌	Logo	应用领域
英特尔 - INTEL		LTE 输入元件可编程逻辑
页数	文件大小	规格书
94页	780K
描述
Loadable PLD, 1.78ns, PBGA356, 35 X 35 MM, 1.27 MM PITCH, BGA-356

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EP20K200CB356C8N 数据手册

APEX 20KC

Programmable Logic

Device

February 2004 ver. 2.2

Data Sheet

■

Programmable logic device (PLD) manufactured using a 0.15-µm all-

Features...

layer copper-metal fabrication process

–

25 to 35% faster design performance than APEX^TM20KE devices

Pin-compatible with APEX 20KE devices

High-performance, low-power copper interconnect

MultiCore^TMarchitecture integrating look-up table (LUT) logic

and embedded memory

–

LUT logic used for register-intensive functions

Embedded system blocks (ESBs) used to implement memory

functions, including first-in first-out (FIFO) buffers, dual-port

RAM, and content-addressable memory (CAM)

■

High-density architecture

–

200,000 to 1 million typical gates (see Table 1)

Up to 38,400 logic elements (LEs)

Up to 327,680 RAM bits that can be used without reducing

available logic

Table 1. APEX 20KC Device Features

Note (1)

Feature

EP20K200C

EP20K400C

EP20K600C

EP20K1000C

Maximum system gates

Typical gates

526,000

200,000

8,320

1,052,000

400,000

16,640

104

1,537,000

600,000

24,320

152

1,772,000

1,000,000

38,400

160

LEs

ESBs

Maximum RAM bits

PLLs (2)

106,496

212,992

311,296

327,680

Speed grades (3)

Maximum macrocells

Maximum user I/O pins

-7, -8, -9

832

-7, -8, -9

1,664

-7, -8, -9

2,432

-7, -8, -9

2,560

376

488

588

708

Notes to Table 1:

(1) The embedded IEEE Std. 1149.1 Joint Test Action Group (JTAG) boundary-scan circuitry contributes up to

57,000 additional gates.

(2) PLL: phase-locked loop.

(3) The -7 speed grade provides the fastest performance.

Altera Corporation

DS-APEX20KC-2.2

12 3 4 5 6 7...94

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