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EP20K200CB652C-8 PDF预览

EP20K200CB652C-8

更新时间: 2024-11-09 15:31:55
品牌 Logo 应用领域
英特尔 - INTEL 输入元件可编程逻辑
页数 文件大小 规格书
88页 1179K
描述
Loadable PLD, PBGA652, 45 X 45 MM, 1.27 MM PITCH, BGA-652

EP20K200CB652C-8 技术参数

生命周期:Obsolete包装说明:LBGA,
Reach Compliance Code:compliantHTS代码:8542.39.00.01
风险等级:5.39JESD-30 代码:S-PBGA-B652
JESD-609代码:e1长度:45 mm
专用输入次数:4I/O 线路数量:376
端子数量:652最高工作温度:85 °C
最低工作温度:组织:4 DEDICATED INPUTS, 376 I/O
输出函数:MACROCELL封装主体材料:PLASTIC/EPOXY
封装代码:LBGA封装形状:SQUARE
封装形式:GRID ARRAY, LOW PROFILE可编程逻辑类型:LOADABLE PLD
认证状态:Not Qualified座面最大高度:1.63 mm
最大供电电压:1.89 V最小供电电压:1.71 V
标称供电电压:1.8 V表面贴装:YES
温度等级:OTHER端子面层:TIN SILVER COPPER
端子形式:BALL端子节距:1.27 mm
端子位置:BOTTOM宽度:45 mm
Base Number Matches:1

EP20K200CB652C-8 数据手册

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APEX 20KC  
Programmable Logic  
Device  
®
October 2001, ver. 1.2  
Data Sheet  
Programmable logic device (PLD) manufactured using a 0.15-µm all-  
Features...  
layer copper-metal fabrication process  
25 to 35% faster design performance than APEXTM 20KE devices  
Pin-compatible with APEX 20KE devices  
High-performance, low-power copper interconnect  
MultiCoreTM architecture integrating look-up table (LUT) logic  
and embedded memory  
LUT logic used for register-intensive functions  
Embedded system blocks (ESBs) used to implement memory  
functions, including first-in first-out (FIFO) buffers, dual-port  
RAM, and content-addressable memory (CAM)  
High-density architecture  
100,000 to 1.5 million typical gates (see Table 1)  
Up to 51,840 logic elements (LEs)  
Up to 442,368 RAM bits that can be used without reducing  
available logic  
Table 1. APEX 20KC Device Features  
Note (1)  
Feature  
EP20K200C  
EP20K400C  
EP20K600C  
EP20K1000C  
EP20K1500C  
Maximum system  
gates  
526,000  
1,052,000  
1,537,000  
1,772,000  
2,392,000  
Typical gates  
LEs  
200,000  
8,320  
52  
400,000  
16,640  
104  
600,000  
24,320  
152  
1,000,000  
38,400  
160  
1,500,000  
51,840  
216  
ESBs  
Maximum RAM  
bits  
106,496  
212,992  
311,296  
327,680  
442,368  
PLLs (2)  
2
4
4
4
4
Speed grades (3)  
-7, -8, -9  
832  
-7, -8, -9  
1,664  
-7, -8, -9  
2,432  
-7, -8, -9  
2,560  
-7, -8, -9  
3,456  
Maximum  
macrocells  
Maximum user I/O  
pins  
376  
488  
588  
708  
808  
Notes:  
(1) The embedded IEEE Std. 1149.1 Joint Test Action Group (JTAG) boundary-scan circuitry contributes up to  
57,000 additional gates.  
(2) PLL: phase-locked loop.  
(3) The -7 speed grade provides the fastest performance.  
Altera Corporation  
1
A-DS-APEX20KC-1.2  

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