DS91C180, DS91D180
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SNLS158M –MARCH 2006–REVISED APRIL 2013
DS91D180/DS91C180 100 MHz M-LVDS Line Driver/Receiver Pair
Check for Samples: DS91C180, DS91D180
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FEATURES
DESCRIPTION
The DS91D180 and DS91C180 are 100 MHz M-
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DC to 100+ MHz / 200+ Mbps Low Power, Low
EMI Operation
LVDS (Multipoint Low Voltage Differential Signaling)
line driver/receiver pairs designed for applications
that utilize multipoint networks (e.g. clock distribution
in ATCA and uTCA based systems). M-LVDS is a
bus interface standard (TIA/EIA-899) optimized for
multidrop networks. Controlled edge rates, tight input
receiver thresholds and increased drive strength are
sone of the key enhancments that make M-LVDS
devices an ideal choice for distributing signals via
multipoint networks.
Optimal for ATCA, uTCA Clock Distribution
Networks
Meets or Exceeds TIA/EIA-899 M-LVDS
Standard
Wide Input Common Mode Voltage for
Increased Noise Immunity
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DS91D180 has Type 1 Receiver Input
DS91C180 has Type 2 Receiver Input for Fail-
Safe Functionality
The DS91D180/DS91C180 driver input accepts
LVTTL/LVCMOS signals and converts them to
differential
M-LVDS
signal
levels.
The
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Industrial Temperature Range
DS91D180/DS91C180 receiver accepts low voltage
differential signals (LVDS, B-LVDS, M-LVDS, LV-
PECL and CML) and converts them to 3V LVCMOS
signals. The DS91D180 device has a M-LVDS type 1
receiver input with no offset.The DS91C180 device
has a type 2 receiver input which enable failsafe
functionality.
Space Saving SOIC-14 Package (JEDEC MS-
012)
Typical Application in an ATCA Clock Distribution Network
Slot Card N
Slot Card N+1
MLVDS Drivers/Receivers
MLVDS Drivers/Receivers
CLK1A (8 KHz)
CLK1B (8 KHz)
80W RT
80W RT
80W RT
80W RT
CLK2A (19.44 MHz)
CLK2B (19.44 MHz)
80W RT
80W RT
80W RT
80W RT
CLK3A (User Defined up to 100 MHz)
CLK3B (User Defined up to 100 MHz)
80W RT
80W RT
80W RT
80W RT
ATCA Backplane
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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