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CY7C1372BV25-167BGI PDF预览

CY7C1372BV25-167BGI

更新时间: 2024-11-08 05:19:23
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
26页 726K
描述
512K x 36/1M x 18 Pipelined SRAM with NoBL Architecture

CY7C1372BV25-167BGI 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:14 X 22 MM, 2.40 MM HEIGHT, PLASTIC, BGA-119针数:119
Reach Compliance Code:not_compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.21
最长访问时间:3.4 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):167 MHzI/O 类型:COMMON
JESD-30 代码:R-PBGA-B119JESD-609代码:e0
内存密度:18874368 bit内存集成电路类型:ZBT SRAM
内存宽度:18湿度敏感等级:3
功能数量:1端子数量:119
字数:1048576 words字数代码:1000000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:1MX18
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:BGA封装等效代码:BGA119,7X17,50
封装形状:RECTANGULAR封装形式:GRID ARRAY
并行/串行:PARALLEL峰值回流温度(摄氏度):220
电源:2.5 V认证状态:Not Qualified
最大待机电流:0.02 A最小待机电流:2.38 V
子类别:SRAMs最大压摆率:0.23 mA
最大供电电压 (Vsup):2.625 V最小供电电压 (Vsup):2.375 V
标称供电电压 (Vsup):2.5 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:1.27 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIEDBase Number Matches:1

CY7C1372BV25-167BGI 数据手册

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CY7C1372BV25  
CY7C1370BV25  
512K x 36/1M x 18 Pipelined SRAM  
with NoBL™ Architecture  
inputs include all addresses, all data inputs, depth-expansion  
Chip Enables (CE1, CE2 and CE3), cycle start input (ADV/LD),  
Clock Enable (CEN), Byte Write Selects (BWSa, BWSb, BWSc  
and BWSd), and Read-Write control (WE). BWSc and BWSd  
apply to CY7C1370BV25 only.  
Address and control signals are applied to the SRAM during  
one clock cycle, and two cycles later, its associated data  
occurs, either Read or Write.  
Features  
• Zero Bus Latency, no dead cycles between Write and  
Read cycles  
• Fast clock speed: 200,167, 150, and 133 MHz  
• Fast access time: 3.0, 3.4, 3.8, 4.2 ns  
• Internally synchronized registered outputs eliminate  
the need to control OE  
A
Clock Enable (CEN) pin allows operation of the  
• Single 2.5V +5%  
• Single WE (Read/Write) control pin  
• Positive clock-edge triggered, address, data, and  
control signal registers for fully pipelined applications  
• Interleaved or linear 4-word burst capability  
• Individual byte Write (BWSa–BWSd) control (may be  
tied LOW)  
• CEN pin to enable clock and suspend operations  
• Three chip enables for simple depth expansion  
• JTAG boundary scan for BGA packaging version  
CY7C1370BV25/CY7C1372BV25 to be suspended as long as  
necessary. All synchronous inputs are ignored when (CEN) is  
HIGH and the internal device registers will hold their previous  
values.  
There are three Chip Enable (CE1, CE2, CE3) pins that allow  
the user to deselect the device when desired. If any one of  
these three are not active when ADV/LD is LOW, no new  
memory operation can be initiated and any burst cycle in  
progress is stopped. However, any pending data transfers  
(Read or Write) will be completed. The data bus will be in  
high-impedance state two cycles after chip is deselected or a  
Write cycle is initiated.  
• Available in 119-ball bump BGA and 100-pin TQFP  
packages  
The CY7C1370BV25 and CY7C1372BV25 have an on-chip  
two-bit burst counter. In the burst mode, the CY7C1370BV25  
and CY7C1372BV25 provide four cycles of data for a single  
address presented to the SRAM. The order of the burst  
sequence is defined by the MODE input pin. The MODE pin  
selects between linear and interleaved burst sequence. The  
ADV/LD signal is used to load a new external address  
(ADV/LD = LOW) or increment the internal burst counter  
(ADV/LD = HIGH)  
Output Enable (OE) and burst sequence select (MODE) are  
the asynchronous signals. OE can be used to disable the  
outputs at any given time. ZZ may be tied to LOW if it is not  
used.  
• Automatic power-down available using zz mode or CE  
deselect  
Functional Description  
The CY7C1370BV25 and CY7C1372BV25 SRAMs are  
designed to eliminate dead cycles when transitions from  
READ to WRITE or vice versa. These SRAMs are optimized  
for 100 percent bus utilization and achieves Zero Bus Latency.  
They integrate 524,288 × 36 and 1,048,576 × 18 SRAM cells,  
respectively, with advanced synchronous peripheral circuitry  
and a 2-bit counter for internal burst operation. The Cypress  
Synchronous Burst SRAM family employs high-speed,  
low-power CMOS designs using advanced single layer  
polysilicon, threelayer metal technology. Each memory cell  
consists of six transistors.  
Four pins are used to implement JTAG test capabilities. The  
JTAG circuitry is used to serially shift data to and from the  
device. JTAG inputs use LVTTL/LVCMOS levels to shift data  
during this testing mode of operation.  
All synchronous inputs are gated by registers controlled by a  
positive-edge-triggered Clock Input (CLK). The synchronous  
Logic Block Diagram  
D
CLK  
Data-In REG.  
CE  
Q
ADV/LD  
A
x
CEN  
CE  
256K × 36/  
512K × 18  
MEMORY  
ARRAY  
1
CE  
CE  
CONTROL  
and WRITE  
LOGIC  
2
DQ  
x
3
WE  
DP  
x
CY7C1370 CY7C1372  
X = 18:0 X = 19:0  
BWS  
x
A
X
Mode  
X = a, b, c, d X = a, b  
X = a, b, c, d X = a, b  
X = a, b, c, d X = a, b  
DQ  
X
DP  
X
BWS  
X
OE  
Cypress Semiconductor Corporation  
3901 North First Street  
San Jose  
CA 95134  
408-943-2600  
Document #: 38-05252 Rev. **  
Revised April 8, 2002  

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