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CY7C1315AV18-167BZC PDF预览

CY7C1315AV18-167BZC

更新时间: 2024-11-16 09:43:47
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
22页 327K
描述
18-Mb QDRTM-II SRAM 4-Word Burst Architecture

CY7C1315AV18-167BZC 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:13 X 15 MM, 1.40 MM HEIGHT, 1 MM PITCH, FBGA-165针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.88
最长访问时间:0.5 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):167 MHzI/O 类型:SEPARATE
JESD-30 代码:R-PBGA-B165JESD-609代码:e0
长度:15 mm内存密度:18874368 bit
内存集成电路类型:QDR SRAM内存宽度:36
湿度敏感等级:3功能数量:1
端子数量:165字数:524288 words
字数代码:512000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:512KX36输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):220电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.42 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.64 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:13 mm
Base Number Matches:1

CY7C1315AV18-167BZC 数据手册

 浏览型号CY7C1315AV18-167BZC的Datasheet PDF文件第2页浏览型号CY7C1315AV18-167BZC的Datasheet PDF文件第3页浏览型号CY7C1315AV18-167BZC的Datasheet PDF文件第4页浏览型号CY7C1315AV18-167BZC的Datasheet PDF文件第5页浏览型号CY7C1315AV18-167BZC的Datasheet PDF文件第6页浏览型号CY7C1315AV18-167BZC的Datasheet PDF文件第7页 
CY7C1311AV18  
CY7C1313AV18  
CY7C1315AV18  
PRELIMINARY  
18-Mb QDR™-II SRAM 4-Word Burst Architecture  
Features  
Functional Description  
• Separate Independent Read and Write Data Ports  
— Supports concurrent transactions  
The CY7C1311AV18/CY7C1313AV18/CY7C1315AV18 are  
1.8V Synchronous Pipelined SRAMs, equipped with QDR-II  
architecture. QDR-II architecture consists of two separate  
ports to access the memory array. The Read port has  
dedicated Data Outputs to support Read operations and the  
Write Port has dedicated Data Inputs to support Write opera-  
tions. QDR-II architecture has separate data inputs and data  
outputs to completely eliminate the need to “turn-around” the  
data bus required with common I/O devices. Access to each  
port is accomplished through a common address bus.  
Addresses for Read and Write addresses are latched on  
alternate rising edges of the input (K) clock. Accesses to the  
QDR-II Read and Write ports are completely independent of  
one another. In order to maximize data throughput, both Read  
and Write ports are equipped with Double Data Rate (DDR)  
interfaces. Each address location is associated with four 8-bit  
words (CY7C1311AV18) or 18-bit words (CY7C1313AV18) or  
36-bit words (CY7C1315AV18) that burst sequentially into or  
out of the device. Since data can be transferred into and out  
of the device on every rising edge of both input clocks (K and  
K and C and C), memory bandwidth is maximized while simpli-  
fying system design by eliminating bus “turn-arounds”.  
• 250-MHz Clock for High Bandwidth  
• 4-Word Burst for reducing address bus frequency  
• Double Data Rate (DDR) interfaces on both Read and  
Write Ports (data transferred at 500 MHz) at 250 MHz  
• Two input clocks (K and K) for precise DDR timing  
— SRAM uses rising edges only  
• Two output clocks (C and C) accounts for clock skew  
and flight time mismatching  
• Echo clocks (CQ and CQ) simplify data capture in high  
speed systems  
• Single multiplexed address input bus latches address  
inputs for both Read and Write ports  
• Separate Port Selects for depth expansion  
• Synchronous internally self-timed writes  
• Available in ×8, ×18, and ×36 configurations  
• Full data coherancy providing most current data  
• Core Vdd=1.8(+/-0.1V);I/O Vddq=1.4V to Vdd)  
• 13 × 15 x 1.4 mm 1.0-mm pitch FBGA package, 165-ball  
Depth expansion is accomplished with Port Selects for each  
(11 × 15 matrix)  
port. Port selects allow each port to operate independently.  
• Variable drive HSTL output buffers  
All synchronous inputs pass through input registers controlled  
by the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C input clocks. Writes are  
conducted with on-chip synchronous self-timed write circuitry.  
• JTAG 1149.1 Compatible test access port  
• Delay Lock Loop (DLL) for accurate data placement  
Configurations  
CY7C1311AV18–2M x 8  
CY7C1313AV18–1M x 18  
CY7C1315AV18–512K x 36  
Logic Block Diagram (CY7C1311AV18)  
D[7:0]  
8
Write Write Write Write  
Address  
Register  
A(18:0)  
Reg Reg Reg  
Reg  
19  
Address  
Register  
A(18:0)  
19  
RPS  
K
Control  
Logic  
CLK  
K
Gen.  
C
C
DOFF  
Read Data Reg.  
32  
CQ  
CQ  
16  
VREF  
WPS  
BWS[1:0]  
Reg.  
Reg.  
Reg.  
Control  
Logic  
16  
8
Q[7:0]  
8
Cypress Semiconductor Corporation  
3901 North First Street  
San Jose, CA 95134  
408-943-2600  
Document #: 38-05498 Rev. *A  
Revised June 1, 2004  

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