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CY15E004Q PDF预览

CY15E004Q

更新时间: 2024-11-07 01:13:03
品牌 Logo 应用领域
赛普拉斯 - CYPRESS /
页数 文件大小 规格书
22页 686K
描述
4-Kbit (512 × 8) Serial (SPI) Automotive F-RAM

CY15E004Q 数据手册

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CY15E004Q  
4-Kbit (512 × 8) Serial (SPI) Automotive  
F-RAM  
4-Kbit (512  
× 8) Serial (SPI) Automotive F-RAM  
Features  
Functional Description  
4-Kbit ferroelectric random access memory (F-RAM) logically  
organized as 512 × 8  
High-endurance 10 trillion (1013) read/writes  
121-year data retention (See the Data Retention and  
Endurance table)  
NoDelay™ writes  
Advanced high-reliability ferroelectric process  
The CY15E004Q is a 4-Kbit nonvolatile memory employing an  
advanced ferroelectric process. A ferroelectric random access  
memory or F-RAM is nonvolatile and performs reads and writes  
similar to a RAM. It provides reliable data retention for 121 years  
while eliminating the complexities, overhead, and system level  
reliability problems caused by serial flash, EEPROM, and other  
nonvolatile memories.  
Very fast serial peripheral interface (SPI)  
Up to 16 MHz frequency  
Direct hardware replacement for serial flash and EEPROM  
Supports SPI mode 0 (0, 0) and mode 3 (1, 1)  
Unlike serial flash and EEPROM, the CY15E004Q performs  
write operations at bus speed. No write delays are incurred. Data  
is written to the memory array immediately after each byte is  
successfully transferred to the device. The next bus cycle can  
commence without the need for data polling. In addition, the  
product offers substantial write endurance compared with other  
nonvolatile memories. The CY15E004Q is capable of supporting  
1013 read/write cycles, or 10 million times more write cycles than  
EEPROM.  
Sophisticated write protection scheme  
Hardware protection using the Write Protect (WP) pin  
Software protection using Write Disable instruction  
Software block protection for 1/4, 1/2, or entire array  
These capabilities make the CY15E004Q ideal for nonvolatile  
memory applications requiring frequent or rapid writes.  
Examples range from data collection, where the number of write  
cycles may be critical, to demanding industrial controls where the  
long write time of serial flash or EEPROM can cause data loss.  
Low power consumption  
300 μA active current at 1 MHz  
10 μA (typ) standby current at +85 °C  
Voltage operation: VDD = 4.5 V to 5.5 V  
Automotive-E temperature: –40 °C to +125 °C  
8-pin small outline integrated circuit (SOIC) package  
AEC Q100 Grade 1 compliant  
The CY15E004Q provides substantial benefits to users of serial  
EEPROM or flash as a hardware drop-in replacement. The  
CY15E004Q uses the high-speed SPI bus, which enhances the  
high-speed write capability of F-RAM technology. The device  
specifications are guaranteed over an automotive-e temperature  
range of –40 °C to +125 °C.  
Restriction of hazardous substances (RoHS) compliant  
Logic Block Diagram  
WP  
Instruction Decoder  
CS  
Clock Generator  
Control Logic  
HOLD  
Write Protect  
SCK  
512 x 8  
F-RAM Array  
Instruction Register  
9
8
Address Register  
Counter  
SI  
SO  
Data I/O Register  
2
Nonvolatile Status  
Register  
Errata: The Write Enable Latch (WEL) bit in the Status Register of CY15E004Q part doesn’t clear after executing the memory write (WRITE) operation at memory  
location(s) from 0x100 to 0x1FF. For more information, see Errata on page 19. Details include errata trigger conditions, scope of impact, available workarounds, and  
silicon revision applicability.  
Cypress Semiconductor Corporation  
Document Number: 002-10031 Rev. *B  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised April 5, 2017  

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