Datasheet > CS62LS4008FI

CS62LS4008FI

更新时间： 2022-12-01 12:20:02

品牌	Logo	应用领域
其他 - ETC		静态存储器
页数	文件大小	规格书
11页	484K
描述
Low Power CMOS SRAM 512K X 8 Bits

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中文翻译

获取价格

数据手册

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CS62LS4008FI 数据手册

Low Power CMOS SRAM

512K X 8 Bits

UC62LS4008

-20/-25

ꢀPIN DESCRIPTION

Name

A0 – A18

CE\

Type

Input

Function

Address inputs for selecting one of the 524,288 x 8 bit words in the RAM

CE\ is active LOW. Chip enable must be active when data read from or write to the device. If chip

enable is not active, the device is deselected and not in a standby power down mode. The DQ

pins will be in high impedance state when the device is deselected.

The Write enable input is active LOW and controls read and write operations. With the chip

selected, when WE\ is HIGH and OE\ is LOW, output data will be present on the DQ pins, when

WE\ is LOW, the data present on the DQ pins will be written into the selected memory location.

The output enable input is active LOW. If the output enable is active while the chip is selected

and the write enable is inactive, data will be present on the DQ pins and they will be enabled.

The DQ pins will be in the high impedance state when OE\ is inactive.

These 8 bi-directional ports are used to read data from or write data into the RAM.

Power Supply

WE\

OE\

Input

DQ0 – DQ7

Vcc

I/O

Power

Ground

Gnd

ꢀTRUTH TABLE

Mode

Not Selected

Output Disabled

Read

WE\

CE\

OE\

I/O state

High Z

D_OUT

Vcc Current

I_SB,I_SB1

I_CC

Write

D_IN

I_CC

ꢀABSOLUTE MAXIMUM RATINGS⁽¹⁾ꢀOPERATING RANGE

AMBIENT

TEMPERATURE

SYMBOL

V_TERM

T_BIAS

PARAMETER

RATING

UNIT

RANGE

V_CC

Terminal Voltage with

Respect to GND

-0.5 to V_CC+0.5

0℃to 70℃

Commercial

3.0V ~ 3.6V

℃

Temperature Under Bias

Storage Temperature

Power Dissipation

-40 to 125

ꢀCAPACITANCE⁽¹⁾(TA=25℃,f=1.0MHz)

℃

T_STG

-50 to 150

PARAMETER

SYMBOL

CONDITIONS MAX.

UNIT

Input

I_OUT

DC Output Current

CIN

VIN=0V

VDQ

Capacitance

Input/Output

Capacitance

1. Stresses greater than those listed under ABSOLUTE

MAXIMUM RATINGS may cause permanent damage to the

device. This is a stress rating only and functional operation of

the device at these or any other conditions above those

indicated in the operational sections of this specification is not

implied. Exposure to absolute maximum rating conditions for

extended periods may affect reliability.

CDQ

1. This parameter is guaranteed and not 100% tested.

U-Chip Technology Corp. LTD. .

Preliminary Rev.1.0

Reserves the right to modify document contents without notice.

PAGE 2

123 4 5 6 7...11

中文翻译

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