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AS4LC2M8S0-8TC PDF预览

AS4LC2M8S0-8TC

更新时间: 2024-01-03 05:51:32
品牌 Logo 应用领域
ALSC 动态存储器
页数 文件大小 规格书
29页 720K
描述
3.3V 2M × 8/1M × 16 CMOS synchronous DRAM

AS4LC2M8S0-8TC 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP2包装说明:TSOP2, TSOP44,.46,32
针数:44Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.02
风险等级:5.92访问模式:DUAL BANK PAGE BURST
最长访问时间:6 ns其他特性:AUTO/SELF REFRESH
最大时钟频率 (fCLK):125 MHzI/O 类型:COMMON
交错的突发长度:1,2,4,8JESD-30 代码:R-PDSO-G44
JESD-609代码:e0长度:18.41 mm
内存密度:16777216 bit内存集成电路类型:SYNCHRONOUS DRAM
内存宽度:8功能数量:1
端口数量:1端子数量:44
字数:2097152 words字数代码:2000000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:2MX8
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:TSOP2封装等效代码:TSOP44,.46,32
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE
峰值回流温度(摄氏度):240电源:3.3 V
认证状态:Not Qualified刷新周期:4096
座面最大高度:1.2 mm自我刷新:YES
连续突发长度:1,2,4,8,FP最大待机电流:0.002 A
子类别:DRAMs最大压摆率:0.13 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.8 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:10.16 mm
Base Number Matches:1

AS4LC2M8S0-8TC 数据手册

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AS4LC2M8S1  
AS4LC1M16S1  
®
Recommended operating conditions  
Parameter  
Symbol  
VCC,VCCQ  
GND  
VIH  
Min  
3.0  
0.0  
2.0  
–0.3†  
2.4  
Nominal  
Max  
3.6  
Unit  
V
Notes  
3.3  
0.0  
Supply voltage  
Input voltage  
0.0  
V
VCC + 0.3  
0.8  
V
8
8
VIL  
V
VOH  
V
Output voltage‡  
VOL  
0.4  
V
Ambient operating temperature  
TA  
0
70  
°C  
V
Min = –1.5V for pulse widths less than 5 ns.  
IL  
I
= –2mA, and I = 2mA.  
OH  
OL  
Recommended operating conditions apply throughout this document unless otherwise specified.  
Absolute maximum ratings  
Parameter  
Symbol  
VIN,VOUT  
VCC,VCCQ  
TSTG  
Min  
–1.0  
–1.0  
–55  
Max  
Unit  
V
Notes  
Input voltage  
+4.6  
+4.6  
+150  
1
Power supply voltage  
V
Storage temperature (plastic)  
Power dissipation  
°C  
W
PD  
Short circuit output current  
IOUT  
50  
mA  
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional  
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to  
absolute maximum rating conditions for extended periods may affect reliability.  
5/21/01; v.1.1  
Alliance Semiconductor  
P. 6 of 29  

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