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ADP165ACPZN-2.3-R7 PDF预览

ADP165ACPZN-2.3-R7

更新时间: 2024-10-28 21:01:23
品牌 Logo 应用领域
亚德诺 - ADI 光电二极管输出元件调节器
页数 文件大小 规格书
23页 620K
描述
Very Low Quiescent Current, 150 mA, with Output Discharge LDO Regulator

ADP165ACPZN-2.3-R7 数据手册

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Data Sheet  
ADP165/ADP166  
ultraviolet (NUV, 200 nm to 400 nm) bands; therefore, they can  
penetrate more deeply into the active silicon.  
LIGHT SENSITIVITY OF WLCSPs  
The WLCSP package option is essentially a silicon die with  
additional post fabrication dielectric and metal processing  
designed to contact solder bumps on the active side of the chip.  
With this package type, the die is exposed to ambient light and  
is subject to photoelectric effects. Light sensitivity analysis of  
a WLCSP mounted on standard PCB material reveals that  
performance may be impacted when the package is illuminated  
directly by high intensity light. No degradation in electrical  
performance is observed due to illumination by low intensity  
(0.1 mW/cm2) ambient light. Direct sunlight can have intensities of  
50 mW/cm2, and office ambient light can be as low as 0.1 mW/cm2.  
Incident light with wavelengths greater than 1100 nm has  
no photoelectric effect on silicon devices because silicon is  
transparent to wavelengths in this range.  
The spectral content of conventional light sources varies  
considerably. Sunlight has a broad spectral range, with peak  
intensity in the visible band that falls off in the NUV and NIR  
bands; fluorescent lamps have significant peaks in the visible  
but not the NUV or NIR bands. Tungsten lighting has a broad  
peak in the longer visible wavelengths with a significant tail in  
the NIR.  
When the WLCSP is assembled on the board with the bump  
side of the die facing the PCB, reflected light from the PCB  
surface is incident on active silicon circuit areas and results in  
the increased leakage currents. No performance degradation occurs  
due to illumination of the backside (substrate) of the WLCSP.  
Efforts have been made at a product level to reduce the effect of  
ambient light; the under bump metal (UBM) has been designed  
to shield the sensitive circuit areas on the active side (bump side) of  
the die. However, if an application encounters any light sensitivity  
with the WLCSP, shielding the bump side of the WLCSP package  
with opaque material eliminates this effect. Shielding can be  
accomplished using materials such as silica-filled liquid epoxies  
like those used in flip-chip underfill techniques.  
All WLCSPs are particularly sensitive to incident light with  
wavelengths in the near infrared range (NIR, 700 nm to 1000 nm).  
Photons in this waveband have a longer wavelength and lower  
energy than photons in the visible (400 nm to 700 nm) and near  
Rev. A | Page 21 of 23  
 

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