Data Sheet
ADF4158
C Version1
Typ
Parameter
Min
Max
Unit
Test Conditions/Comments
NOISE CHARACTERISTICS
Normalized Phase Noise Floor
−216
−110
dBc/Hz
dBc/Hz
PLL loop bandwidth = 500 kHz;
measured at 100 kHz offset
100 kHz offset; normalized to 1 GHz
At VCO output
4
(PNSYNTH
)
5
Normalized 1/f Noise (PN1_f
Phase Noise Performance6
5805 MHz Output7
)
−93
dBc/Hz
At 5 kHz offset, 32 MHz PFD frequency
1 Operating temperature for C version: −40°C to +125°C.
2 AC coupling ensures AVDD/2 bias.
3 Guaranteed by design. Sample tested to ensure compliance.
4 The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20 log(N) (where N is the N divider
value) and 10 log(fPFD). PNSYNTH = PNTOT − 10 log(fPFD) − 20 log(N).
5 The PLL phase noise is composed of 1/f (flicker) noise plus the normalized PLL noise floor. The formula for calculating the 1/f noise contribution at an RF frequency, fRF
and at a frequency offset f is given by PN = PN1_f + 10 log(10 kHz/f) + 20 log(fRF/1 GHz). Both the normalized phase noise floor and flicker noise are modeled in ADIsimPLL™.
6 The phase noise is measured with the EVAL-ADF4158EB1Z and the Agilent E5052A phase noise system.
,
7 fREFIN = 128 MHz; fPFD = 32 MHz; offset frequency = 5 kHz; RFOUT = 5805 MHz; INT = 181; FRAC = 13631488; loop bandwidth = 100 kHz.
TIMING SPECIFICATIONS
AVDD = DVDD = SDVDD = 2.7 V to 3.3 V; VP = AVDD to 5.5 V; AGND = DGND = SDGND = 0 V; TA = TMIN to TMAX, dBm referred to 50 Ω,
unless otherwise noted.
Table 2. Write Timing
Parameter
Limit at TMIN to TMAX (C Version)
Unit
Test Conditions/Comments
LE setup time
DATA to CLK setup time
DATA to CLK hold time
CLK high duration
CLK low duration
t1
t2
t3
t4
t5
t6
t7
20
10
10
25
25
10
20
ns min
ns min
ns min
ns min
ns min
ns min
ns min
CLK to LE setup time
LE pulse width
Write Timing Diagram
t4
t5
CLK
t2
t3
DB2
(CONTROL BIT C3)
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
DB31 (MSB)
DB30
DATA
LE
t7
t1
t6
LE
Figure 2. Write Timing Diagram
Rev. I | Page 5 of 35