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AD5516_03 PDF预览

AD5516_03

更新时间: 2022-05-20 03:03:22
品牌 Logo 应用领域
亚德诺 - ADI /
页数 文件大小 规格书
16页 228K
描述
16-Channel, 12-Bit Voltage-Output DAC with 14-Bit Increment Mode

AD5516_03 数据手册

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AD5516  
PIN FUNCTION DESCRIPTIONS (continued)  
Mnemonic  
Function  
SCLK  
Serial Clock Input. Data is clocked into the shift register on the falling edge of SCLK. This operates at clock  
speeds up to 20 MHz.  
DIN  
Serial Data Input. Data must be valid on the falling edge of SCLK.  
DOUT  
Serial Data Output. DOUT can be used for daisy-chaining a number of devices together or for reading back the  
data in the shift register for diagnostic purposes. Data is clocked out on DOUT on the rising edge of SCLK and is  
valid on the falling edge of SCLK.  
Active High Control Input. This pin is tied high to enable Daisy-Chain Mode.  
Active Low Control Input. This resets all DAC registers to power-on value.  
DCEN1  
RESET2  
PD1  
Active High Control Input. All DACs go into power-down mode when this pin is high. The DAC outputs go into  
a high impedance state.  
BUSY  
Active Low Output. This signal tells the user that the analog calibration loop is active. It goes low during conversion.  
The duration of the pulse on BUSY determines the maximum DAC update rate, fUPDATE. Further writes to the  
AD5516 are ignored while BUSY is active.  
NOTES  
1Internal pull-down device on this logic input. Therefore it can be left floating and will default to a logic low condition.  
2Internal pull-up device on this logic input. Therefore it can be left floating and will default to a logic high condition.  
TERMINOLOGY  
DC Crosstalk  
Integral Nonlinearity (INL)  
This is the dc change in the output level of one DAC at midscale  
in response to a full-scale code change (all 0s to all 1s and vice  
versa) and output change of another DAC. It is expressed in LSB.  
This is a measure of the maximum deviation from a straight line  
passing through the endpoints of the DAC transfer function. It is  
expressed in LSBs.  
Output Settling Time  
Differential Nonlinearity (DNL)  
This is the time taken from when the last data bit is clocked into  
the DAC until the output has settled to within ±0.5 LSB of its  
final value (see TPC 7).  
Differential nonlinearity (DNL) is the difference between the  
measured change and the ideal 1 LSB change between any two  
adjacent codes. A specified DNL of –1 LSB maximum ensures  
monotonicity.  
Digital-to-Analog Glitch Impulse  
This is the area of the glitch injected into the analog output when  
the code in the DAC register changes state. It is specified as the  
area of the glitch in nV-s when the digital code is changed by  
1 LSB at the major carry transition (011...11 to 100...00 or  
100...00 to 011...11).  
Bipolar Zero Error  
Bipolar zero error is the deviation of the DAC output from the ideal  
midscale of 0 V. It is measured with 10...00 loaded to the DAC.  
It is expressed in LSBs.  
Positive Full-Scale Error  
Digital Crosstalk  
This is the error in the DAC output voltage with all 1s loaded to  
the DAC. Ideally the DAC output voltage, with all 1s loaded to the  
DAC registers, should be 2.5 V – 1 LSB (AD5516-1), 5 V – 1 LSB  
(AD5516-2), and 10 V – 1 LSB (AD5516-3). It is expressed in LSBs.  
This is the glitch impulse transferred to the output of one DAC at  
midscale while a full-scale code change (all 1s to all 0s and vice  
versa) is being written to another DAC. It is expressed in nV-s.  
Analog Crosstalk  
Negative Full-Scale Error  
This is the area of the glitch transferred to the output (VOUT) of  
one DAC due to a full-scale change in the output (VOUT) of  
another DAC. The area of the glitch is expressed in nV-s.  
This is the error in the DAC output voltage with all 0s loaded to  
the DAC. Ideally the DAC output voltage, with all 0s loaded to the  
DAC registers, should be –2.5 V (AD5516-1), –5 V (AD5516-2),  
and –10 V (AD5516-3). It is expressed in LSBs.  
Digital Feedthrough  
This is a measure of the impulse injected into the analog outputs  
from the digital control inputs when the part is not being written  
to, i.e., SYNC is high. It is specified in nV-s and measured with  
a worst-case change on the digital input pins, e.g., from all 0s to  
all 1s and vice versa.  
Output Temperature Coefficient  
This is a measure of the change in analog output with changes in  
temperature. It is expressed in ppm/C of FSR.  
DC Power Supply Rejection Ratio  
DC power supply rejection ratio (PSRR) is a measure of the change  
in analog output for a change in supply voltage (VDD and VSS).  
It is expressed in dB. VDD and VSS are varied ±5%.  
Output Noise Spectral Density  
This is a measure of internally generated random noise. Random  
noise is characterized as a spectral density (voltage per root hertz).  
It is measured in nV/(Hz)1/2  
.
REV. B  
–7–  

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