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AD5323BRUZ-REEL7 PDF预览

AD5323BRUZ-REEL7

更新时间: 2024-01-04 21:24:10
品牌 Logo 应用领域
亚德诺 - ADI 光电二极管转换器
页数 文件大小 规格书
28页 488K
描述
2.5 V to 5.5 V, 230 µA, Dual Rail-to-Rail Voltage Output 12-Bit DAC

AD5323BRUZ-REEL7 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:TSSOP
包装说明:TSSOP,针数:16
Reach Compliance Code:unknown风险等级:5.73
最大模拟输出电压:5.499 V最小模拟输出电压:0.001 V
转换器类型:D/A CONVERTER输入位码:BINARY
输入格式:SERIALJESD-30 代码:R-PDSO-G16
JESD-609代码:e3长度:5 mm
最大线性误差 (EL):0.1953%湿度敏感等级:1
位数:12功能数量:1
端子数量:16最高工作温度:105 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:TSSOP封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH峰值回流温度(摄氏度):260
认证状态:COMMERCIAL座面最大高度:1.2 mm
标称安定时间 (tstl):8 µs标称供电电压:3 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:MATTE TIN
端子形式:GULL WING端子节距:0.65 mm
端子位置:DUAL处于峰值回流温度下的最长时间:40
宽度:4.4 mmBase Number Matches:1

AD5323BRUZ-REEL7 数据手册

 浏览型号AD5323BRUZ-REEL7的Datasheet PDF文件第7页浏览型号AD5323BRUZ-REEL7的Datasheet PDF文件第8页浏览型号AD5323BRUZ-REEL7的Datasheet PDF文件第9页浏览型号AD5323BRUZ-REEL7的Datasheet PDF文件第11页浏览型号AD5323BRUZ-REEL7的Datasheet PDF文件第12页浏览型号AD5323BRUZ-REEL7的Datasheet PDF文件第13页 
AD5303/AD5313/AD5323  
TERMINOLOGY  
DAC-to-DAC Crosstalk  
Relative Accuracy or Integral Nonlinearity (INL)  
For the DAC, relative accuracy or integral nonlinearity is a  
measure of the maximum deviation, in LSB, from a straight  
line passing through the actual endpoints of the DAC transfer  
function. A typical INL error vs. code plot can be seen in  
Figure 7, Figure 8, and Figure 9.  
This is the glitch impulse transferred to the output of one DAC  
due to a digital code change and subsequent output change of  
the other DAC. This includes both digital and analog crosstalk.  
It is measured by loading one of the DACs with a full-scale code  
change (all 0s to all 1s and vice versa) while keeping  
and monitoring the output of the other DAC. The area of the  
glitch is expressed in nV-s.  
LDAC  
low  
Differential Nonlinearity (DNL)  
Differential nonlinearity is the difference between the measured  
change and the ideal 1 LSB change between any two adjacent  
codes. A specified DNL of 1 LSB maximum ensures monotonic-  
ity. This DAC is guaranteed monotonic by design. A typical  
DNL error vs. code plot can be seen in Figure 10, Figure 11, and  
Figure 12.  
DC Crosstalk  
This is the dc change in the output level of one DAC in response  
to a change in the output of the other DAC. It is measured with  
a full-scale output change on one DAC while monitoring the  
other DAC. It is expressed in microvolts.  
Power Supply Rejection Ratio (PSRR)  
Offset Error  
This indicates how the output of the DAC is affected by changes  
in the supply voltage. PSRR is the ratio of the change in VOUT to  
a change in VDD for full-scale output of the DAC. It is measured  
in decibels. VREF is held at 2 V and VDD is varied 10ꢀ.  
This is a measure of the offset error of the DAC and the output  
amplifier. It is expressed as a percentage of the full-scale range.  
Gain Error  
This is a measure of the span error of the DAC. It is the devia-  
tion in slope of the actual DAC transfer characteristic from the  
ideal expressed as a percentage of the full-scale range.  
Reference Feedthrough  
This is the ratio of the amplitude of the signal at the DAC output to  
the reference input when the DAC output is not being updated  
Offset Error Drift  
This is a measure of the change in offset error with changes in  
temperature. It is expressed in (ppm of full-scale range)/°C.  
LDAC  
(that is,  
is high). It is expressed in decibels.  
Total Harmonic Distortion (THD)  
This is the difference between an ideal sine wave and its  
attenuated version using the DAC. The sine wave is used as  
the reference for the DAC and the THD is a measure of the  
harmonics present on the DAC output. It is measured in  
decibels.  
Gain Error Drift  
This is a measure of the change in gain error with changes in  
temperature. It is expressed in (ppm of full-scale range)/°C.  
Major-Code Transition Glitch Energy  
Major-code transition glitch energy is the energy of the impulse  
injected into the analog output when the code in the DAC register  
changes state. It is normally specified as the area of the glitch in  
nV-s and is measured when the digital code is changed by 1 LSB  
at the major carry transition (011 . . . 11 to 100 . . . 00 or 100 . . .  
00 to 011 . . . 11).  
Multiplying Bandwidth  
The amplifiers within the DAC have a finite bandwidth. The  
multiplying bandwidth is a measure of this. A sine wave on the  
reference (with full-scale code loaded to the DAC) appears on  
the output. The multiplying bandwidth is the frequency at  
which the output amplitude falls to 3 dB below the input.  
Digital Feedthrough  
Channel-To-Channel Isolation  
Digital feedthrough is a measure of the impulse injected into  
the analog output of the DAC from the digital input pins of the  
device, but is measured when the DAC is not being written to  
This is a ratio of the amplitude of the signal at the output of one  
DAC to a sine wave on the reference input of the other DAC. It  
is measured in decibels.  
SYNC  
(
held high). It is specified in nV-s and is measured with a  
full-scale change on the digital input pins, that is, from all 0s to  
all 1s and vice versa.  
Analog Crosstalk  
This is the glitch impulse transferred to the output of one DAC  
due to a change in the output of the other DAC. It is measured  
by loading one of the input registers with a full-scale code  
LDAC  
change (all 0s to all 1s and vice versa) while keeping  
LDAC  
high. Then pulse  
low and monitor the output of the  
DAC whose digital code was not changed. The area of the  
glitch is expressed in nV-s.  
Rev. B | Page 10 of 28  
 
 
 

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