AVX European Space Agency and CECC
Surface Mount Ceramic Capacitor Products
DIELECTRIC TYPES USED
Type I
Type II
ꢀ X7R
ꢀ 2C1
ꢀ NP0
ꢀ TPC Code: C
ꢀ TPC Code: Z
ꢀ TPC Code: G
ELECTRICAL MEASUREMENT CONDITIONS FOR CECC CHIPS: T2 / T3 / T5 / T6
Type
1
2
TPC code
Classification
C
Z
2R1
X7R
IEC/CECC
EIA
1B
C0G
NP0
CG
DIN
MIL
Capacitance change
With temperature & : Ubias = 0
Ubias = UR
30ppm/ꢀC
15%
N.A.
Typical ageing (%/dec.)
Reference temperature
0
1.5
22ꢀC 3ꢀC
22ꢀC 3ꢀC
Capacitance
and D.F.
Frequency
C ≤ 1000 pF
C > 1000 pF
F = 1MHz
F = 1 kHz
C ≤ 100 pF
F = 1MHz
F = 1 kHz
C > 100 pF
measurement
Voltage
Um ≤ 5 Vrms
Um ≤ 0.3 Vrms 0.2
DF < 250 .10-4
Dissipation
Factor (DF)
C ≤ 50 pF DF < 1.5 (150/C + 7).10-4
C>50 pF DF < 15.10-4
Insulation Resistance
under UR /1 mn
For C ≤ 10nF: Ri > 100 GΩ or
For C ≤ 10nF: Ri > 100 GΩ or
For C > 10nF: Ri x C > 1000s
For C > 10nF: Ri x Cr > 1000s
Proof voltage
For UR ≤ 100V : 2.5 x UR
For UR > 100V : 1.5 UR + 100V
For UR ≤ 100V: 2.5 x UR
For UR >100V: 1.5 x UR + 100V
Note: ESA Chips are strictly measured vs ESA spec. 3009 + detail spec.
ELECTRICAL MEASUREMENT CONDITIONS FOR ESA CHIPS: LEVEL B & C
Type
1
2
TPC code
Classification
C
Z
2R1
X7R
G
2C1
IEC/CECC
EIA
1B
C0G
NP0
CG
DIN
MIL
BX
Capacitance change
With temperature & : Ubias = 0
Ubias = UR
30ppm/ꢀC
20%
*-60/+20%
20%
-30/+20%
Typical ageing (%/dec.)
Reference temperature
0
1.5
22ꢀC 3ꢀC
1.5
22ꢀC 3ꢀC
22ꢀC 3ꢀC
Capacitance
and D.F.
Frequency
C ≤ 1000 pF
C > 1000 pF
F = 1MHz
F = 1 kHz
C ≤ 100 pF
F = 1MHz
F = 1 kHz
C > 100 pF
measurement
Voltage
Um ≤ 5 Vrms
Um ≤ 1 Vrms
DF < 250 .10-4
Dissipation
Factor (DF)
C ≤ 50 pF DF < 1.5 (150/C + 7).10-4
C>50 pF DF < 15.10-4
Insulation Resistance
under UR /1 mn
Ri > 100 GΩ
For C ≤ 10nF: Ri > 100 GΩ or
For C > 10nF: Ri x C > 1000s
Proof voltage
For UR < 500V : 2.5 x UR
For UR < 500V: 2.5 x UR
For UR = 500V: 2 x UR
*Typical value for this dielectric class
Note: ESA Chips are strictly measured vs ESA spec. 3009 + detail spec.
3