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2SK3907 PDF预览

2SK3907

更新时间: 2024-02-26 01:30:24
品牌 Logo 应用领域
东芝 - TOSHIBA 稳压器开关
页数 文件大小 规格书
6页 213K
描述
Silicon N-Channel MOS Type Switching Regulator Applications

2SK3907 技术参数

是否无铅: 不含铅生命周期:Lifetime Buy
零件包装代码:SC-65包装说明:FLANGE MOUNT, R-PSFM-T3
针数:3Reach Compliance Code:unknown
风险等级:5.36雪崩能效等级(Eas):552 mJ
外壳连接:DRAIN配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:500 V最大漏极电流 (Abs) (ID):23 A
最大漏极电流 (ID):23 A最大漏源导通电阻:0.23 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PSFM-T3
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:FLANGE MOUNT极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):150 W最大脉冲漏极电流 (IDM):92 A
认证状态:Not Qualified子类别:FET General Purpose Power
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:SINGLE晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

2SK3907 数据手册

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2SK3907  
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (MACHII π-MOSVI)  
2SK3907  
Switching Regulator Applications  
Unit: mm  
Small gate charge: Qg = 60 nC (typ.)  
Low drain-source ON resistance: R  
High forward transfer admittance: |Y | = 12 S (typ.)  
= 0.18 Ω (typ.)  
DS (ON)  
fs  
Low leakage current: I  
= 500 μA (V  
= 500 V)  
= 10 V, I = 1 mA)  
D
DSS  
DS  
Enhancement model: V = 2.0~4.0 V (V  
th  
DS  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
500  
500  
±30  
23  
V
V
V
DSS  
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
V
GS  
DGR  
V
GSS  
DC  
(Note 1)  
I
D
Drain current  
A
1. GATE  
Pulse (Note 1)  
I
92  
DP  
2. DRAIN (HEATSINK)  
3. SOURCE  
Drain power dissipation (Tc = 25°C)  
P
150  
W
D
AS  
AR  
JEDEC  
Single pulse avalanche energy  
E
552  
mJ  
(Note 2)  
JEITA  
SC-65  
Avalanche current  
I
23  
15  
A
TOSHIBA  
2-16C1B  
Repetitive avalanche energy (Note 3)  
Channel temperature  
E
mJ  
°C  
°C  
AR  
Weight: 4.6 g (typ.)  
T
ch  
150  
Storage temperature range  
T
stg  
-55~150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate  
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and  
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).  
Thermal Characteristics  
2
Characteristic  
Symbol  
Max  
Unit  
Thermal resistance, channel to case  
Thermal resistance, channel to ambient  
R
0.833  
50  
°C/W  
°C/W  
th (ch-c)  
R
th (ch-a)  
1
Note 1: Ensure that the channel temperature does not exceed 150°C during  
use of the device.  
Note 2:  
V
DD  
= 90 V, T = 25°C (initial), L = 1.77 mH, I  
= 23 A, R = 25 Ω  
AR G  
ch  
Note 3: Repetitive rating: pulse width limited by maximum channel temperature  
This transistor is an electrostatic-sensitive device. Handle with care.  
3
1
2006-11-06  

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