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2SC3357-T1-A

更新时间: 2024-01-29 22:21:15
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描述
2SC3357-T1-A

2SC3357-T1-A 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete包装说明:SMALL OUTLINE, R-PSSO-F3
针数:3Reach Compliance Code:compliant
ECCN代码:EAR99Factory Lead Time:1 week
风险等级:5.42Base Number Matches:1

2SC3357-T1-A 数据手册

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DATA SHEET  
NPN SILICON RF TRANSISTOR  
2SC3357  
NPN EPITAXIAL SILICON RF TRANSISTOR  
FOR HIGH-FREQUENCY LOW-NOISE AMPLIFICATION  
3-PIN POWER MINIMOLD  
FEATURES  
Low noise and high gain  
NF = 1.1 dB TYP., Ga = 7.5 dB TYP. @ VCE = 10 V, IC = 7 mA, f = 1 GHz  
NF = 1.8 dB TYP., Ga = 9.0 dB TYP. @ VCE = 10 V, IC = 40 mA, f = 1 GHz  
High power gain : MAG = 10 dB TYP. @ IC = 40 mA, f = 1 GHz  
Large Ptot : Ptot = 1.2 W (Mounted on 16 cm2 × 0.7 mm (t) ceramic substrate)  
Small package : 3-pin power minimold package  
ORDERING INFORMATION  
Part Number  
Quantity  
Supplying Form  
2SC3357  
25 pcs (Non reel)  
1 kpcs/reel  
• 12 mm wide embossed taping  
• Collector face the perforation side of the tape  
2SC3357-T1  
Remark To order evaluation samples, contact your nearby sales office.  
The unit sample quantity is 25 pcs.  
ABSOLUTE MAXIMUM RATINGS (TA = +25°C)  
Parameter  
Collector to Base Voltage  
Collector to Emitter Voltage  
Emitter to Base Voltage  
Collector Current  
Symbol  
VCBO  
VCEO  
VEBO  
IC  
Ratings  
Unit  
V
20  
12  
V
3.0  
V
100  
mA  
W
P
tot Note  
1.2  
Total Power Dissipation  
Junction Temperature  
Storage Temperature  
Tj  
150  
°C  
°C  
Tstg  
65 to +150  
Note Mounted on 16 cm2 × 0.7 mm (t) ceramic substrate  
Caution Observe precautions when handling because these devices are sensitive to electrostatic discharge.  
The information in this document is subject to change without notice. Before using this document, please confirm that  
this is the latest version.  
Not all devices/types available in every country. Please check with local NEC Compound Semiconductor Devices  
representative for availability and additional information.  
Document No. PU10211EJ01V0DS (1st edition)  
(Previous No. P10357EJ4V1DS00)  
The mark shows major revised points.  
Date Published January 2003 CP(K)  
Printed in Japan  
NEC Compound Semiconductor Devices 1985, 2003  

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