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1N4148UBCA PDF预览

1N4148UBCA

更新时间： 2024-01-16 16:49:41
品牌 Logo 应用领域
美高森美 - MICROSEMI /
页数 文件大小 规格书
19页 104K
描述
PERFORMANCE SPECIFICATION

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1N4148UBCA 技术参数

是否Rohs认证： 符合生命周期：Active
Reach Compliance Code：unknownECCN代码：EAR99
HTS代码：8541.10.00.70风险等级：5.76
配置：SINGLE二极管类型：RECTIFIER DIODE
最大正向电压 (VF)：0.715 V最大非重复峰值正向电流：2 A
元件数量：1最高工作温度：150 °C
最大输出电流：0.15 A最大重复峰值反向电压：75 V
最大反向恢复时间：0.004 µs子类别：Rectifier Diodes
表面贴装：YESBase Number Matches：1

1N4148UBCA 数据手册

 浏览型号1N4148UBCA的Datasheet PDF文件第7页浏览型号1N4148UBCA的Datasheet PDF文件第8页浏览型号1N4148UBCA的Datasheet PDF文件第9页浏览型号1N4148UBCA的Datasheet PDF文件第11页浏览型号1N4148UBCA的Datasheet PDF文件第12页浏览型号1N4148UBCA的Datasheet PDF文件第13页 
MIL-PRF-19500/116L  
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as specified  
herein.  
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I  
herein. Electrical measurements (end-points) shall be in accordance with Table I, group A, subgroup 2 herein.  
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for  
subgroup testing in table VIb (JANTX and JANTXV) of MIL-PRF-19500 and as specified herein. Electrical  
measurements (end-points) shall be in accordance with Table I, group A, subgroup 2 herein except for the thermal  
impedance test.  
4.4.2.1 Group B inspection, table VIb (JANTX, JANTXV) of MIL-PRF-19500.  
Subgroup  
B2  
Method  
2005  
Conditions  
IF = 100 mA, axial tensile stress = 8 lbs, TA = +150 C; (not applicable to UR or UB  
package). (This test shall be performed as the first test of subgroup 2).  
B3  
1027  
2075  
TA = +30 C 5 C, VRWM = 75 V(pk), f = 50-60 Hz (see 4.5.1); 1N914: IO = 5 mA,  
1N4531: IO = 125 mA, 1N4148-1: IO = 200 mA.  
B4  
B5  
See 4.5.4 herein.  
3101  
R
R
JL = 250 C/W, .375 inch (9.52 mm) lead length (non-surface mount).  
JL 100 C/W (UR), R JC = 150 C/W (UB).  
or 4081  
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for  
subgroup testing in table VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in  
accordance with Table I, group A, subgroup 2 herein except for the thermal impedance test.  
Subgroup  
C2  
Method  
1056  
Conditions  
100 cycles.  
C2  
2036  
Tension: Test condition A, t = 15 seconds, weight = 10 pounds. Lead fatigue:  
Test condition E. Terminal strength and lead fatigue not applicable to  
UB or UR devices.  
C6  
1026  
TA = +30 C 5 C, VRWM = 75 V(pk), f = 50-60 Hz (see 4.5.1), for:  
1N914  
IO = 75 mA.  
1N4531  
IO = 125 mA.  
1N4148-1 IO = 200 mA.  
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.  
4.5.1 Pulse measurements. Conditions for pulse measurements shall be specified in section 4 of MIL-STD-750.  
4.5.2 Life tests. AC tests shall be conducted with a half-sine wave of the peak voltage specified herein impressed  
across the diode in the reverse direction, followed by a half-sine waveform of the average rectified current specified  
herein. The forward conduction angle of the rectified current shall be not greater than 180 degree nor less than  
150 degree.  
10  
1...78910111213...19

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