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V62/03616-01XE PDF预览

V62/03616-01XE

更新时间: 2024-11-24 11:58:23
品牌 Logo 应用领域
德州仪器 - TI 数字信号处理器
页数 文件大小 规格书
44页 621K
描述
DIGITAL SIGNAL PROCESSOR

V62/03616-01XE 技术参数

是否Rohs认证: 不符合生命周期:Not Recommended
零件包装代码:QFP包装说明:QFP, QFP144,1.2SQ
针数:144Reach Compliance Code:compliant
ECCN代码:3A001.A.2.CHTS代码:8542.31.00.01
风险等级:5.22地址总线宽度:24
桶式移位器:YES位大小:32
边界扫描:NO最大时钟频率:50 MHz
外部数据总线宽度:32格式:FLOATING POINT
集成缓存:YES内部总线架构:MULTIPLE
JESD-30 代码:S-PQFP-G144JESD-609代码:e4
长度:28 mm低功率模式:YES
湿度敏感等级:4DMA 通道数量:2
外部中断装置数量:4端子数量:144
计时器数量:2最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:PLASTIC/EPOXY
封装代码:QFP封装等效代码:QFP144,1.2SQ
封装形状:SQUARE封装形式:FLATPACK
峰值回流温度(摄氏度):260电源:5 V
认证状态:Not QualifiedRAM(字数):512
座面最大高度:4.1 mm子类别:Digital Signal Processors
最大压摆率:475 mA最大供电电压:5.25 V
最小供电电压:4.75 V标称供电电压:5 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式:GULL WING端子节距:0.65 mm
端子位置:QUAD处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:28 mmuPs/uCs/外围集成电路类型:DIGITAL SIGNAL PROCESSOR, OTHER
Base Number Matches:1

V62/03616-01XE 数据手册

 浏览型号V62/03616-01XE的Datasheet PDF文件第2页浏览型号V62/03616-01XE的Datasheet PDF文件第3页浏览型号V62/03616-01XE的Datasheet PDF文件第4页浏览型号V62/03616-01XE的Datasheet PDF文件第5页浏览型号V62/03616-01XE的Datasheet PDF文件第6页浏览型号V62/03616-01XE的Datasheet PDF文件第7页 
ꢀꢁ ꢂꢃ ꢄꢅ ꢂꢃ ꢆꢇ ꢈ  
ꢉꢊ ꢋꢊ ꢌꢍꢎ ꢀꢊ ꢋ ꢏꢍꢎ ꢈꢐ ꢑ ꢅꢇ ꢀ ꢀꢑ ꢐ  
SGUS038 − AUGUST 2002  
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
D
SMJ320C30 and SMJ320C31 Object Code  
Compatible  
Fabricated Using Enhanced Performance  
Implanted CMOS (EPIC) Technology by  
Texas Instruments  
D
D
Extended Temperature Performance of  
−55°C to 125°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
D
144-Pin Plastic Quad Flatpack  
(PCM Suffix) 5 V  
D
D
D
Enhanced Product Change Notification  
D
Eight Extended-Precision Registers  
Qualification Pedigree  
D
Two Address Generators With Eight  
Auxiliary Registers and Two Auxiliary  
Register Arithmetic Units (ARAUs)  
High-Performance Floating-Point Digital  
Signal Processor (DSP)  
SM320C32-50EP (5 V)  
− 40-ns Instruction Cycle Time  
− 275 MOPS  
− 50 MFLOPS  
− 25 MIPS  
SM320C32-60EP (5 V)  
− 33-ns Instruction Cycle Time  
− 330 MOPS  
D
D
D
Two Low-Power Modes  
Two- and Three-Operand Instructions  
Parallel Arithmetic Logic Unit (ALU) and  
Multiplier Execution in a Single Cycle  
D
Block-Repeat Capability  
D
Zero-Overhead Loops With Single-Cycle  
Branches  
− 60 MFLOPS  
− 30 MIPS  
D
D
Conditional Calls and Returns  
Interlocked Instructions for  
Multiprocessing Support  
D
D
32-Bit High-Performance CPU  
16-/32-Bit Integer and 32-/40-Bit  
Floating-Point Operations  
D
One External Pin, PRGW, That Configures  
the External-Program-Memory Width to  
16 or 32 Bits  
D
32-Bit Instruction Word, 24-Bit Addresses  
D
Two 256 × 32-Bit Single-Cycle, Dual-Access  
On-Chip RAM Blocks  
D
Two Sets of Memory Strobes (STRB0 and  
STRB1) and One I/O Strobe (IOSTRB)  
Allow Zero-Glue Logic Interface to Two  
Banks of Memory and One Bank of External  
Peripherals  
D
D
Flexible Boot-Program Loader  
On-Chip Memory-Mapped Peripherals:  
− One Serial Port  
− Two 32-Bit Timers  
− Two-Channel Direct Memory Access  
(DMA) Coprocessor With Configurable  
Priorities  
D
D
D
Separate Bus-Control Registers for Each  
Strobe-Control Wait-State Generation,  
External Memory Width, and Data Type Size  
STRB0 and STRB1 Memory Strobes Handle  
8-, 16-, or 32-Bit External Data Accesses  
(Reads and Writes)  
D
Enhanced External Memory Interface That  
Supports 8-/16-/32-Bit-Wide External RAM  
for Data Access and Program Execution  
From 16-/32-Bit-Wide External RAM  
Multiprocessor Support Through the HOLD  
and HOLDA Signals Is Valid for All Strobes  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.  
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this  
component beyond specified performance and environmental limits.  
EPIC is a trademark of Texas Instruments Incorporated.  
All trademarks are the property of their respective owners.  
ꢌꢞ  
Copyright 2002, Texas Instruments Incorporated  
ꢚ ꢞ ꢛ ꢚꢓ ꢔꢨ ꢖꢕ ꢙ ꢡꢡ ꢟꢙ ꢗ ꢙ ꢘ ꢞ ꢚ ꢞ ꢗ ꢛ ꢣ  
1
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  

V62/03616-01XE 替代型号

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V62/03616-02XE TI

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