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U6264BSA07G1 PDF预览

U6264BSA07G1

更新时间: 2024-11-05 20:13:07
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器光电二极管内存集成电路
页数 文件大小 规格书
9页 162K
描述
8KX8 STANDARD SRAM, 70ns, PDSO28, 0.330 INCH, LEAD FREE, SOP1-28

U6264BSA07G1 技术参数

是否无铅: 不含铅生命周期:Obsolete
零件包装代码:SOIC包装说明:SOP,
针数:28Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.41
风险等级:5.44最长访问时间:70 ns
JESD-30 代码:R-PDSO-G28JESD-609代码:e3
内存密度:65536 bit内存集成电路类型:STANDARD SRAM
内存宽度:8功能数量:1
端子数量:28字数:8192 words
字数代码:8000工作模式:ASYNCHRONOUS
最高工作温度:125 °C最低工作温度:-40 °C
组织:8KX8封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装形状:RECTANGULAR
封装形式:SMALL OUTLINE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED认证状态:Not Qualified
座面最大高度:2.85 mm最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:AUTOMOTIVE端子面层:MATTE TIN
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:8.405 mmBase Number Matches:1

U6264BSA07G1 数据手册

 浏览型号U6264BSA07G1的Datasheet PDF文件第2页浏览型号U6264BSA07G1的Datasheet PDF文件第3页浏览型号U6264BSA07G1的Datasheet PDF文件第4页浏览型号U6264BSA07G1的Datasheet PDF文件第5页浏览型号U6264BSA07G1的Datasheet PDF文件第6页浏览型号U6264BSA07G1的Datasheet PDF文件第7页 
U6264B  
Standard 8K x 8 SRAM  
Features  
Description  
! 8192 x 8 bit static CMOS RAM  
! 70 ns Access Times  
! Common data inputs and  
outputs  
The U6264B is a static RAM manu-  
factured using a CMOS process  
technology with the following ope-  
rating modes:  
address, data input and control  
signals W or G, the operating cur-  
rent (at IO = 0 mA) drops to the  
value of the operating current in the  
Standby mode. The Read cycle is  
finished by the falling edge of E2 or  
W, or by the rising edge of E1,  
respectively.  
! Three-state outputs  
! Typ. operating supply current  
70 ns: 10 mA  
- Read  
- Write  
- Standby  
- Data Retention  
The memory array is based on a  
6-transistor cell.  
! Standby current:  
< 2 µA at T 70 °C  
The circuit is activated by the rising  
edge of E2 (at E1 = L), or the falling  
edge of E1 (at E2 = H). The  
address and control inputs open  
simultaneously. According to the  
information of W and G, the data  
inputs, or outputs, are active. In a  
Read cycle, the data outputs are  
activated by the falling edge of G,  
afterwards the data word read will  
be available at the outputs DQ0 -  
DQ7. After the address change, the  
data outputs go High-Z until the  
new read information is available.  
The data outputs have no preferred  
state. If the memory is driven by  
CMOS levels in the active state,  
and if there is no change of the  
Data retention is guaranteed down  
to 2 V. With the exception of E2, all  
inputs consist of NOR gates, so  
that no pull-up/pull-down resistors  
are required. This gate circuit  
allows to achieve low power  
standby requirements by activation  
with TTL-levels too.  
a
! Data retention current at 2 V:  
< 1 µA at T 70 °C  
a
! TTL/CMOS-compatible  
! Automatic reduction of power  
dissipation in long Read or Write  
cycles  
! Power supply voltage 5 V  
! Operating temperature ranges:  
0 to 70 °C  
If the circuit is inactivated by  
E2 = L, the standby current (TTL)  
drops to 150 µA typ.  
-40 to 85 °C  
-40 to 125 °C  
! QS 9000 Quality Standard  
! ESD protection > 2000 V  
(MIL STD 883C M3015.7)  
! Latch-up immunity > 100 mA  
! Packages: PDIP28 (600 mil)  
SOP28 (330 mil)  
Pin Configuration  
Pin Description  
Signal Name Signal Description  
n.c.  
A12  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
1
2
3
4
5
6
7
8
VCC  
A0 - A12  
Address Inputs  
Data In/Out  
W (WE)  
E2 (CE2)  
A8  
A9  
A11  
G (OE)  
A10  
E1 (CE1)  
DQ7  
DQ6  
DQ5  
DQ0 - DQ7  
Chip Enable 1  
Chip Enable 2  
Output Enable  
Write Enable  
Power Supply Voltage  
Ground  
E1  
E2  
PDIP  
SOP  
G
9
W
A0  
10  
11  
12  
13  
14  
DQ0  
DQ1  
DQ2  
VSS  
VCC  
VSS  
DQ4  
DQ3  
not connected  
n.c.  
Top View  
April 20, 2004  
1

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