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ꢃ ꢌ ꢇꢍꢎ ꢀ ꢏꢐꢏ ꢁꢑ ꢒ ꢇꢀꢑ ꢇꢓꢎꢒ ꢎ ꢀꢏꢁ ꢂꢑ ꢐꢔꢈ ꢕꢀꢈ ꢕ ꢖ ꢗꢎ ꢀꢘ
ꢖꢈ ꢕꢎꢏ ꢁ ꢂꢑ ꢐꢀ ꢕꢑ ꢁ ꢏꢐꢓ ꢃꢃ ꢏꢐꢏ ꢁꢑ ꢒ ꢎ ꢐꢉ ꢙ ꢀꢖ
SGLS152A − JANUARY 2004 − REVISED FEBRUARY 2006
D
Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
DW PACKAGE
(TOP VIEW)
A0
A1
V
CC
EOC
D
D
Extended Temperature Performance of
−40°C to 125°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
A2
I/O CLOCK
ADDRESS
DATA OUT
A3
A4
D
D
D
D
D
D
D
D
D
D
D
Enhanced Product Change Notification
A5
15 CS
†
Qualification Pedigree
14
13
12
11
A6
REF+
REF−
A10
10-Bit Resolution A/D Converter
11 Analog Input Channels
A7
A8
GND
A9
Three Built-In Self-Test Modes
Inherent Sample-and-Hold Function
Total Unadjusted Error . . . 1 LSB Max
On-Chip System Clock
End-of-Conversion (EOC) Output
Terminal Compatible With TLC542
CMOS Technology
description
The TLC1542-EP and TLC1543-EP are CMOS 10-bit switched-capacitor successive-approximation
analog-to-digital converters. These devices have three inputs, a 3-state output chip select (CS), input/output
clock (I/O CLOCK), address input (ADDRESS), and data output (DATA OUT)] that provide a direct 4-wire
interface to the serial port of a host processor. The TLC1542-EP and TLC1543-EP allow high-speed data
transfers from the host.
In addition to a high-speed A/D converter and versatile control capability, the TLC1542-EP and TLC1543-EP
have an on-chip 14-channel multiplexer that can select any one of 11 analog inputs or any one of three internal
self-test voltages. The sample-and-hold function is automatic. At the end of the A/D conversion, the
end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated
in the TLC1542-EP and TLC1543-EP features differential high-impedance reference inputs that facilitate
ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A
switched-capacitor design allows low-error conversion over the full operating free-air temperature range.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
†
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this
component beyond specified performance and environmental limits.
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ꢞꢦ ꢝꢢ ꢩ ꢢ ꢪ ꢞꢨ ꢡꢢ ꢣ ꢤꢫ ꢀꢚ ꢢ ꢜ ꢤ ꢥ ꢤꢠꢜ ꢞꢦ ꢢꢥ ꢟ ꢚ ꢝꢢ ꢩꢛꢟ ꢢ ꢛꢜ ꢛꢣꢝ ꢛꢟꢥ ꢤꢢ ꢝ ꢞꢣ ꢤꢚ ꢢ ꢨꢥ ꢬꢢꢭ ꢜꢮ
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Copyright 2006, Texas Instruments Incorporated
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1
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