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TC7S86FU(TE85L,F) PDF预览

TC7S86FU(TE85L,F)

更新时间: 2024-11-19 15:53:59
品牌 Logo 应用领域
东芝 - TOSHIBA 石英晶振
页数 文件大小 规格书
7页 189K
描述
XOR Gate 1-Element 2-IN CMOS 5-Pin SSOP T/R

TC7S86FU(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Obsolete
Reach Compliance Code:unknown风险等级:5.82
Base Number Matches:1

TC7S86FU(TE85L,F) 数据手册

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TC7S86F/FU  
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic  
TC7S86F, TC7S86FU  
EXCLUSIVE OR Gate  
TC7S86F  
Features  
High Speed  
: t  
: I  
10ns (Typ.) at V  
= 5 V  
pd =  
CC  
Low power dissipation  
High noise immunity  
Output drive capability  
= 1 μA (Max) at Ta = 25°C  
CC  
: V  
= V  
= 28% V  
(Min)  
NIH  
NIL  
CC  
: 5 LSTTL Loads  
Symmetrical Output Impedance : |I | = I = 2mA (Min)  
OH  
OL  
(SMV)  
Balanced propagation delays  
: t  
t  
pLH pHL  
TC7S86FU  
Wide operating voltage range : V  
= 2 to 6 V  
CC  
Marking  
Product name  
E 8  
(USV)  
Weight  
SSOP5-P-0.95  
SSOP5-P-0.65A  
: 0.016 g (Typ.)  
: 0.006 g (Typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Supply voltage  
Symbol  
Rating  
Unit  
Pin Assignment (top view)  
V
0.5 to 7.0  
V
V
CC  
DC input voltage  
V
0.5 to V  
+ 0.5  
IN  
CC  
CC  
IN B  
IN A  
GND  
1
2
3
5
V
CC  
DC output voltage  
Input diode current  
Output diode current  
DC output current  
V
0.5 to V  
+ 0.5  
V
OUT  
I
±20  
mA  
mA  
mA  
mA  
mW  
°C  
IK  
I
±20  
±12.5  
±25  
OK  
I
OUT  
4
OUT Y  
DC V /ground current  
CC  
I
CC  
Power dissipation  
P
200  
D
Storage temperature  
Lead temperature (10 s)  
T
stg  
65 to 150  
T
L
260  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
1
2009-08-05  

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