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SST39VF160-90-4C-B2K PDF预览

SST39VF160-90-4C-B2K

更新时间: 2024-11-28 23:34:31
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其他 - ETC 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
24页 264K
描述
EEPROM

SST39VF160-90-4C-B2K 数据手册

 浏览型号SST39VF160-90-4C-B2K的Datasheet PDF文件第2页浏览型号SST39VF160-90-4C-B2K的Datasheet PDF文件第3页浏览型号SST39VF160-90-4C-B2K的Datasheet PDF文件第4页浏览型号SST39VF160-90-4C-B2K的Datasheet PDF文件第5页浏览型号SST39VF160-90-4C-B2K的Datasheet PDF文件第6页浏览型号SST39VF160-90-4C-B2K的Datasheet PDF文件第7页 
16 Megabit (x16) Multi-Purpose Flash  
SST39LF160 / SST39VF160  
DataSheet  
FEATURES:  
Organized as 1M x16  
LatchedAddressandData  
1
Single Voltage Read and Write Operations  
FastEraseandWord-Program:  
-
-
3.0-3.6VforSST39LF160  
2.7-3.6VforSST39VF160  
-
-
-
-
-
Sector-Erase Time: 18 ms (typical)  
Block-Erase Time: 18 ms (typical)  
Chip-Erase Time: 70 ms (typical)  
Word-Program Time: 14 µs (typical)  
ChipRewriteTime:  
2
SuperiorReliability  
-
-
Endurance: 100,000 Cycles (typical)  
Greater than 100 years Data Retention  
15 seconds (typical) for SST39LF/VF160  
Automatic Write Timing  
InternalVPPGeneration  
End-of-WriteDetection  
3
LowPowerConsumption:  
-
-
-
Active Current: 15 mA (typical)  
Standby Current: 4 µA (typical)  
Auto Low Power Mode: 4 µA (typical)  
-
4
-
-
Toggle Bit  
Data#Polling  
Sector-EraseCapability  
Uniform 2 KWord sectors  
Block-EraseCapability  
Uniform 32 KWord blocks  
FastReadAccessTime:  
-
5
CMOS I/O Compatibility  
JEDECStandard  
-
-
Flash EEPROM Pinouts and command sets  
6
PackagesAvailable  
-
-
55 ns for SST39LF160  
70 and 90 ns for SST39VF160  
-
-
48-Pin TSOP (12mm x 20mm)  
48-Ball TFBGA (8mm x 10mm and 6mm x 8mm)  
7
8
PRODUCTDESCRIPTION  
sumed is a function of the applied voltage, current, and  
timeofapplication.Sinceforanygivenvoltagerange,the  
SuperFlashtechnologyuseslesscurrenttoprogramand  
has a shorter erase time, the total energy consumed  
during any Erase or Program operation is less than  
alternative flash technologies. These devices also im-  
proveflexibilitywhileloweringthecostforprogram,data,  
andconfigurationstorageapplications.  
The SST39LF/VF160 devices are 1M x16 CMOS Multi-  
Purpose Flash (MPF) manufactured with SST’s propri-  
etary, highperformanceCMOSSuperFlashtechnology.  
The split-gate cell design and thick oxide tunneling  
injectorattainbetterreliabilityandmanufacturabilitycom-  
paredwithalternateapproaches.TheSST39LF160write  
(Program or Erase) with a 3.0-3.6V power supply. The  
SST39VF160 write (Program or Erase) with a 2.7-3.6V  
power supply. These devices conform to JEDEC stan-  
dard pinouts for x16 memories.  
9
10  
11  
12  
13  
14  
15  
16  
The SuperFlash technology provides fixed Erase and  
Program times, independent of the number of Erase/  
Program cycles that have occurred. Therefore the sys-  
temsoftwareorhardwaredoesnothavetobemodifiedor  
de-rated as is necessary with alternative flash technolo-  
gies, whose Erase and Program times increase with  
accumulated Erase/Program cycles.  
Featuring high performance Word-Program, the  
SST39LF/VF160 devices provide a typical Word-Pro-  
gram time of 14 µsec.These devices use Toggle Bit or  
Data# Polling to indicate the completion of Program  
operation.Toprotectagainstinadvertentwrite,theyhave  
on-chip hardware and Software Data Protection  
schemes.Designed,manufactured,andtestedforawide  
spectrum of applications, these devices are offered with  
aguaranteedenduranceof10,000cycles.Dataretention  
is rated at greater than 100 years.  
To meet high density, surface mount requirements, the  
SST39LF/VF160areofferedin48-pinTSOPand48-ball  
TFBGA packages. See Figures 1 and 2 for pinouts.  
DeviceOperation  
Commands are used to initiate the memory operation  
functions of the device. Commands are written to the  
deviceusingstandardmicroprocessorwritesequences.  
AcommandiswrittenbyassertingWE#lowwhilekeeping  
CE# low. The address bus is latched on the falling edge  
of WE# or CE#, whichever occurs last. The data bus is  
latched on the rising edge of WE# or CE#, whichever  
occurs first.  
TheSST39LF/VF160devicesaresuitedforapplications  
that require convenient and economical updating of pro-  
gram, configuration, or data memory. For all system  
applications,theysignificantlyimproveperformanceand  
reliability,whileloweringpowerconsumption.Theyinher-  
ently use less energy during Erase and Program than  
alternative flash technologies. The total energy con-  
©2000SiliconStorageTechnology,Inc.  
TheSSTlogoandSuperFlashareregisteredtrademarksofSiliconStorageTechnology,Inc.MPFisatrademarkofSiliconStorageTechnology,Inc.  
399-2 11/00  
S71145  
Thesespecificationsaresubjecttochangewithoutnotice.  

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