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SN74LVC1G17DBVE4 PDF预览

SN74LVC1G17DBVE4

更新时间: 2024-09-15 12:15:03
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德州仪器 - TI /
页数 文件大小 规格书
26页 1174K
描述
SINGLE SCHMITT-TRIGGER BUFFER

SN74LVC1G17DBVE4 数据手册

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SN74LVC1G17  
www.ti.com  
SCES351S JULY 2001REVISED JUNE 2011  
SINGLE SCHMITT-TRIGGER BUFFER  
Check for Samples: SN74LVC1G17  
1
FEATURES  
2
Available in the Texas Instruments NanoFree  
Latch-Up Performance Exceeds 100 mA Per  
JESD 78, Class II  
ESD Protection Exceeds JESD 22  
Package  
Supports 5-V VCC Operation  
Inputs Accept Voltages to 5.5 V  
Max tpd of 4.6 ns at 3.3 V  
Low Power Consumption, 10-μA Max ICC  
±24-mA Output Drive at 3.3 V  
2000-V Human-Body Model (A114-A)  
200-V Machine Model (A115-A)  
1000-V Charged-Device Model (C101)  
Ioff Supports Live Insertion, Partial Power  
Down Mode, and Back Drive Protection  
DBV PACKAGE  
(TOP VIEW)  
DCK PACKAGE  
(TOP VIEW)  
DRL PACKAGE  
(TOP VIEW)  
1
2
3
5
4
N.C.  
A
VCC  
1
2
3
5
N.C.  
VCC  
1
2
3
N.C.  
A
5
4
VCC  
A
GND  
Y
4
GND  
Y
GND  
Y
DRY PACKAGE  
(TOP VIEW)  
DSF PACKAGE  
(TOP VIEW)  
1
2
3
6
5
4
VCC  
N.C.  
1
2
3
6
5
4
N.C.  
A
VCC  
A
N.C.  
Y
N.C.  
Y
GND  
N.C. – No internal connection  
See mechanical drawings for dimensions.  
GND  
YZP PACKAGE  
(TOP VIEW)  
Table 1. YZP PACKAGE TERMINAL  
ASSIGNMENTS  
A1  
B1  
C1  
A2  
B2  
C2  
DNU  
A
VCC  
1
2
VCC  
No ball  
Y
A
B
C
DNU  
A
GND  
Y
GND  
DNU – Do not use  
Table 2. YZV PACKAGE TERMINAL  
ASSIGNMENTS (continued)  
YZV PACKAGE  
(TOP VIEW)  
ASSIGNMENTS  
A1  
B1  
A2  
B2  
A
VCC  
Y
1
A
2
VCC  
Y
GND  
A
B
GND  
Table 2. YZV PACKAGE TERMINAL  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
NanoFree is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 20012011, Texas Instruments Incorporated  

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