SN54LVC00A, SN74LVC00A
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
www.ti.com
SCAS279P–JANUARY 1993–REVISED JULY 2005
FEATURES
•
•
Operate From 1.65 V to 3.6 V
•
•
Latch-Up Performance Exceeds 250 mA Per
JESD 17
Specified From –40°C to 85°C, –40°C to 125°C,
and –55°C to 125°C
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
•
•
•
Inputs Accept Voltages to 5.5 V
Max tpd of 4.3 ns at 3.3 V
Typical VOLP (Output Ground Bounce)
– 1000-V Charged-Device Model (C101)
<0.8 V at VCC = 3.3 V, TA = 25°C
xxxxxx
xxxxxx
•
Typical VOHV (Output VOH Undershoot)
>2 V at VCC = 3.3 V, TA = 25°C
SN54LVC00A . . . J OR W PACKAGE
SN74LVC00A . . . D, DB, NS, OR PW PACKAGE
(TOP VIEW)
SN74LVC00A . . . RGY PACKAGE
(TOP VIEW)
SN54LVC00A . . . FK PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
1A
1B
V
CC
14
13
1
14
3
2
1
20 19
18
4B
4A
NC
4Y
NC
3B
1Y
NC
2A
4
5
6
7
8
1B
1Y
2A
2B
2Y
13 4B
2
3
4
5
6
1Y
2A
2B
2Y
12 4A
17
16
15
14
12
11
10
9
4A
4Y
3B
3A
4Y
3B
3A
3Y
11
10
9
NC
2B
GND
8
9 10 11 12 13
7
8
NC - No internal connection
DESCRIPTION/ORDERING INFORMATION
The SN54LVC00A quadruple 2-input positive-NAND gate is designed for 2.7-V to 3.6-V VCC operation, and the
SN74LVC00A quadruple 2-input positive-NAND gate is designed for 1.65-V to 3.6-V VCC operation.
The 'LVC00A devices perform the Boolean function Y = A • B or Y = A + B in positive logic.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 1993–2005, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
On products compliant to MIL-PRF-38535, all parameters are
Instruments standard warranty. Production processing does not
tested unless otherwise noted. On all other products, production
necessarily include testing of all parameters.
processing does not necessarily include testing of all parameters.