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SN74AHC1G86-EP_16 PDF预览

SN74AHC1G86-EP_16

更新时间： 2024-11-05 02:58:47
品牌 Logo 应用领域
德州仪器 - TI 输入元件
页数 文件大小 规格书
8页 210K
描述
SINGLE 2-INPUT EXCLUSIVE-OR GATE

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SN74AHC1G86-EP_16 数据手册

 浏览型号SN74AHC1G86-EP_16的Datasheet PDF文件第2页浏览型号SN74AHC1G86-EP_16的Datasheet PDF文件第3页浏览型号SN74AHC1G86-EP_16的Datasheet PDF文件第4页浏览型号SN74AHC1G86-EP_16的Datasheet PDF文件第5页浏览型号SN74AHC1G86-EP_16的Datasheet PDF文件第6页浏览型号SN74AHC1G86-EP_16的Datasheet PDF文件第7页 
SN74AHC1G86-EP  
SINGLE 2-INPUT EXCLUSIVE-OR GATE  
www.ti.com  
SCLS709–FEBRUARY 2008  
1
FEATURES  
•
•
•
•
Max tpd of 10 ns at 5 V  
•
Controlled Baseline  
Low Power Consumption, 10 µA Max ICC  
±8 mA Output Drive at 5 V  
–
–
–
One Assembly Site  
One Test Site  
Schmitt Trigger Action at All Inputs Makes the  
Circuit Tolerant for Slower Input Rise and Fall  
Time  
One Fabrication Site  
•
•
Extended Temperature Performance of –55°C  
to 125°C  
•
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
Enhanced Diminishing Manufacturing Sources  
(DMS) Support  
•
•
ESD Protection Exceeds JESD 22  
•
•
•
Enhanced Product-Change Notification  
(1)  
–
–
–
2000-V Human-Body Model (A114-A)  
200-V Machine Model (A115-A)  
Qualification Pedigree  
Operating Range of 2 V to 5.5 V  
1000-V Charged-Device Model (C101)  
(1) Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
DCK PACKAGE  
(TOP VIEW)  
DBV PACKAGE  
(TOP VIEW)  
DRL PACKAGE  
(TOP VIEW)  
A
B
VCC  
1
2
3
5
1
2
3
5
A
B
VCC  
1
2
3
5
4
A
B
VCC  
4
GND  
Y
4
GND  
Y
Y
GND  
See mechanical drawings for dimensions.  
DESCRIPTION/ORDERING INFORMATION  
The SN74AHC1G86 is a single 2-input exclusive-OR gate. The device performs the Boolean function Y = A  
or Y = AB + AB in positive logic.  
B
A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced  
in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the  
output.  
ORDERING INFORMATION(1)  
ORDERABLE PART  
TA  
PACKAGE(2)  
SOT (SC-70) - DCK Reel of 3000  
TOP-SIDE MARKING(3)  
CGB  
NUMBER  
–55°C to 125°C  
SN74AHC1G86MDCKREP  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
website at www.ti.com.  
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.  
(3) The actual top-side marking has one additional character that designates the assembly/test site.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2008, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
12345678

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