生命周期: | Obsolete | 包装说明: | LFQFP, |
Reach Compliance Code: | unknown | 风险等级: | 5.73 |
其他特性: | SCANNABLE; A-PORT WITHOUT SERIES RESISTOR | 系列: | ABT |
JESD-30 代码: | S-PQFP-G64 | 长度: | 10 mm |
负载电容(CL): | 50 pF | 逻辑集成电路类型: | BOUNDARY SCAN REG BUS TRANSCEIVER |
位数: | 9 | 功能数量: | 2 |
端口数量: | 2 | 端子数量: | 64 |
最高工作温度: | 85 °C | 最低工作温度: | -40 °C |
输出特性: | 3-STATE WITH SERIES RESISTOR | 输出极性: | TRUE |
封装主体材料: | PLASTIC/EPOXY | 封装代码: | LFQFP |
封装形状: | SQUARE | 封装形式: | FLATPACK, LOW PROFILE, FINE PITCH |
最大电源电流(ICC): | 27 mA | 传播延迟(tpd): | 6.2 ns |
认证状态: | Not Qualified | 座面最大高度: | 1.6 mm |
最大供电电压 (Vsup): | 5.5 V | 最小供电电压 (Vsup): | 4.5 V |
标称供电电压 (Vsup): | 5 V | 表面贴装: | YES |
技术: | BICMOS | 温度等级: | INDUSTRIAL |
端子形式: | GULL WING | 端子节距: | 0.5 mm |
端子位置: | QUAD | 宽度: | 10 mm |
Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SN74ABTH182504A | TI |
获取价格 |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74ABTH182504APM | TI |
获取价格 |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74ABTH182646A | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | |
SN74ABTH182646APM | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | |
SN74ABTH182646APMLE | TI |
获取价格 |
ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64 | |
SN74ABTH182652A | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | |
SN74ABTH182652APM | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | |
SN74ABTH182652APMLE | TI |
获取价格 |
ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64 | |
SN74ABTH18502A | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74ABTH18502AHV | TI |
获取价格 |
ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68 |