Datasheet > SN74ABTH182652A

SN74ABTH182652A

更新时间： 2024-11-24 23:06:15

品牌	Logo	应用领域
德州仪器 - TI		总线收发器测试
页数	文件大小	规格书
37页	574K
描述
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

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SN74ABTH182652A 数据手册

SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A

SCAN TEST DEVICES WITH

18-BIT BUS TRANSCEIVERS AND REGISTERS

SCBS167D – AUGUST 1993 – REVISED JULY 1996

Members of the Texas Instruments

One Boundary-Scan Cell Per I/O

SCOPE Family of Testability Products

Architecture Improves Scan Efficiency

Members of the Texas Instruments

Widebus Family

SCOPE Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions and Optional CLAMP and

HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Device Identification

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Include D-Type Flip-Flops and Control

Circuitry to Provide Multiplexed

Transmission of Stored and Real-Time Data

Bus Hold on Data Inputs Eliminates the

Need for External Pullup Resistors

– Even-Parity Opcodes

B-Port Outputs of ’ABTH182652A Devices

Have Equivalent 25-Ω Series Resistors, So

No External Resistors Are Required

Packaged in 64-Pin Plastic Thin Quad Flat

(PM) Packages Using 0.5-mm

Center-to-Center Spacings and 68-Pin

Ceramic Quad Flat (HV) Packages Using

25-mil Center-to-Center Spacings

State-of-the-Art EPIC-ΙΙB BiCMOS Design

SN54ABTH18652A, SN54ABTH182652A . . . HV PACKAGE

(TOP VIEW)

1 68 67 66 65 64 63 62 61

1A3

1A4

1A5

GND

1A6

1A7

1A8

1A9

1B4

1B5

1B6

GND

1B7

1B8

1B9

2B1

2B2

2B3

2B4

GND

2B5

2B6

2B7

2A1

2A2

2A3

GND

2A4

2A5

2A6

27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43

NC – No internal connection

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE, Widebus, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

UNLESS OTHERWISE NOTED this document contains PRODUCTION

DATA information current as of publication date. Products conform to

specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all

parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...37

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与SN74ABTH182652A相关器件

型号	品牌	获取价格	描述	数据表
SN74ABTH182652APM	TI	获取价格	SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN74ABTH182652APMLE	TI	获取价格	ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
SN74ABTH18502A	TI	获取价格	SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74ABTH18502AHV	TI	获取价格	ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68
SN74ABTH18502APM	TI	获取价格	SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74ABTH18502APMG4	TI	获取价格	SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74ABTH18502APMLE	TI	获取价格	暂无描述
SN74ABTH18502APMR	TI	获取价格	SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74ABTH18504A	TI	获取价格	SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN74ABTH18504APM	TI	获取价格	SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

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