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SN74ABTH18504APM PDF预览

SN74ABTH18504APM

更新时间: 2024-11-24 23:06:15
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器逻辑集成电路测试输出元件信息通信管理
页数 文件大小 规格书
35页 547K
描述
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

SN74ABTH18504APM 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:QFP
包装说明:LFQFP, QFP64,.47SQ,20针数:64
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:1.59
其他特性:WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE控制类型:INDEPENDENT CONTROL
计数方向:BIDIRECTIONAL系列:ABT
JESD-30 代码:S-PQFP-G64JESD-609代码:e4
长度:10 mm负载电容(CL):50 pF
逻辑集成电路类型:BOUNDARY SCAN REG BUS TRANSCEIVER最大I(ol):0.064 A
湿度敏感等级:3位数:20
功能数量:1端口数量:2
端子数量:64最高工作温度:85 °C
最低工作温度:-40 °C输出特性:3-STATE
输出极性:TRUE封装主体材料:PLASTIC/EPOXY
封装代码:LFQFP封装等效代码:QFP64,.47SQ,20
封装形状:SQUARE封装形式:FLATPACK, LOW PROFILE, FINE PITCH
包装方法:TRAY峰值回流温度(摄氏度):260
电源:5 V最大电源电流(ICC):27 mA
Prop。Delay @ Nom-Sup:5.5 ns传播延迟(tpd):5.5 ns
认证状态:Not Qualified座面最大高度:1.6 mm
子类别:Bus Driver/Transceivers最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:BICMOS
温度等级:INDUSTRIAL端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式:GULL WING端子节距:0.5 mm
端子位置:QUAD处于峰值回流温度下的最长时间:NOT SPECIFIED
翻译:N/A宽度:10 mm
Base Number Matches:1

SN74ABTH18504APM 数据手册

 浏览型号SN74ABTH18504APM的Datasheet PDF文件第2页浏览型号SN74ABTH18504APM的Datasheet PDF文件第3页浏览型号SN74ABTH18504APM的Datasheet PDF文件第4页浏览型号SN74ABTH18504APM的Datasheet PDF文件第5页浏览型号SN74ABTH18504APM的Datasheet PDF文件第6页浏览型号SN74ABTH18504APM的Datasheet PDF文件第7页 
SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A  
SCAN TEST DEVICES WITH  
20-BIT UNIVERSAL BUS TRANSCEIVERS  
SCBS165C – AUGUST 1993 – REVISED JULY 1996  
Members of the Texas Instruments  
One Boundary-Scan Cell Per I/O  
SCOPE Family of Testability Products  
Architecture Improves Scan Efficiency  
Members of the Texas Instruments  
Widebus Family  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions and Optional CLAMP and  
HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
– Sample Inputs/Toggle Outputs  
– Binary Count From Outputs  
– Device Identification  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
UBT (Universal Bus Transceiver)  
Combines D-Type Latches and D-Type  
Flip-Flops for Operation in Transparent,  
Latched, or Clocked Mode  
Bus Hold on Data Inputs Eliminates the  
Need for External Pullup Resistors  
– Even-Parity Opcodes  
Packaged in 64-Pin Plastic Thin Quad Flat  
(PM) Packages Using 0.5-mm  
Center-to-Center Spacings and 68-Pin  
Ceramic Quad Flat (HV) Packages Using  
25-mil Center-to-Center Spacings  
B-Port Outputs of ABTH182504A Devices  
Have Equivalent 25-Series Resistors, So  
No External Resistors Are Required  
State-of-the-Art EPIC-ΙΙB BiCMOS Design  
SN54ABTH18504A, SN54ABTH182504A . . . HV PACKAGE  
(TOP VIEW)  
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A4  
A5  
A6  
GND  
A7  
A8  
A9  
A10  
NC  
B5  
B6  
B7  
GND  
B8  
B9  
B10  
V
CC  
NC  
V
B11  
B12  
B13  
B14  
GND  
B15  
B16  
B17  
CC  
A11  
A12  
A13  
GND  
A14  
A15  
A16  
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43  
NC – No internal connection  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE, Widebus, UBT, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
UNLESS OTHERWISE NOTED this document contains PRODUCTION  
DATA information current as of publication date. Products conform to  
specifications per the terms of Texas Instruments standard warranty.  
Production processing does not necessarily include testing of all  
parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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