生命周期: | Obsolete | 包装说明: | QFF, |
Reach Compliance Code: | unknown | 风险等级: | 5.56 |
其他特性: | WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION | 系列: | ABT |
JESD-30 代码: | S-GQFP-F68 | 长度: | 12.51 mm |
逻辑集成电路类型: | BOUNDARY SCAN REG BUS TRANSCEIVER | 位数: | 9 |
功能数量: | 2 | 端口数量: | 2 |
端子数量: | 68 | 最高工作温度: | 85 °C |
最低工作温度: | -40 °C | 输出特性: | 3-STATE |
输出极性: | TRUE | 封装主体材料: | CERAMIC, GLASS-SEALED |
封装代码: | QFF | 封装形状: | SQUARE |
封装形式: | FLATPACK | 传播延迟(tpd): | 5.5 ns |
认证状态: | Not Qualified | 座面最大高度: | 3.86 mm |
最大供电电压 (Vsup): | 5.5 V | 最小供电电压 (Vsup): | 4.5 V |
标称供电电压 (Vsup): | 5 V | 表面贴装: | YES |
技术: | BICMOS | 温度等级: | INDUSTRIAL |
端子形式: | FLAT | 端子节距: | 0.635 mm |
端子位置: | QUAD | 宽度: | 12.51 mm |
Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SN74ABTH18502APM | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74ABTH18502APMG4 | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74ABTH18502APMLE | TI |
获取价格 |
暂无描述 | |
SN74ABTH18502APMR | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74ABTH18504A | TI |
获取价格 |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74ABTH18504APM | TI |
获取价格 |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74ABTH18504APMLE | TI |
获取价格 |
暂无描述 | |
SN74ABTH18504APMR | TI |
获取价格 |
ABT SERIES, 20-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64, GREEN, PLASTIC, LQF | |
SN74ABTH18646A | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | |
SN74ABTH18646APM | TI |
获取价格 |
SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |