SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
Members of the Texas Instruments
One Boundary-Scan Cell Per I/O
SCOPE Family of Testability Products
Architecture Improves Scan Efficiency
Members of the Texas Instruments
Widebus Family
SCOPE Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
UBT (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
– Even-Parity Opcodes
Packaged in 64-Pin Plastic Thin Quad Flat
(PM) Packages Using 0.5-mm
Center-to-Center Spacings and 68-Pin
Ceramic Quad Flat (HV) Packages Using
25-mil Center-to-Center Spacings
B-Port Outputs of ’ABTH182504A Devices
Have Equivalent 25-Ω Series Resistors, So
No External Resistors Are Required
State-of-the-Art EPIC-ΙΙB BiCMOS Design
SN54ABTH18504A, SN54ABTH182504A . . . HV PACKAGE
(TOP VIEW)
9
8
7
6
5
4
3
2 1 68 67 66 65 64 63 62 61
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
A4
A5
A6
GND
A7
A8
A9
A10
NC
B5
B6
B7
GND
B8
B9
B10
V
CC
NC
V
B11
B12
B13
B14
GND
B15
B16
B17
CC
A11
A12
A13
GND
A14
A15
A16
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
NC – No internal connection
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, UBT, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
Copyright 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265