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SN74ABT8652DW

更新时间： 2024-11-24 23:06:11
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器触发器逻辑集成电路测试光电二极管输出元件信息通信管理PC
页数 文件大小 规格书
25页 367K
描述
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

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SN74ABT8652DW 技术参数

是否无铅：不含铅是否Rohs认证：符合
生命周期：Active零件包装代码：SOIC
包装说明：SOIC-28针数：28
Reach Compliance Code：compliantHTS代码：8542.39.00.01
Factory Lead Time：1 week风险等级：2.11
Samacsys Confidence：Samacsys Status：Released
Samacsys PartID：605101Samacsys Pin Count：28
Samacsys Part Category：Integrated CircuitSamacsys Package Category：Other
Samacsys Footprint Name：SOIC127P1030X265-28NSamacsys Released Date：2017-01-12 12:59:53
Is Samacsys：N其他特性：INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; MULTIPLEXED TRANSMISSION OF REGISTERED/REAL TIME DATA
控制类型：INDEPENDENT CONTROL计数方向：BIDIRECTIONAL
系列：ABTJESD-30 代码：R-PDSO-G28
JESD-609代码：e4长度：17.9 mm
负载电容（CL）：50 pF逻辑集成电路类型：BOUNDARY SCAN REG BUS TRANSCEIVER
最大I（ol）：0.064 A湿度敏感等级：1
位数：8功能数量：1
端口数量：2端子数量：28
最高工作温度：85 °C最低工作温度：-40 °C
输出特性：3-STATE输出极性：TRUE
封装主体材料：PLASTIC/EPOXY封装代码：SOP
封装等效代码：SOP28,.4封装形状：RECTANGULAR
封装形式：SMALL OUTLINE包装方法：TUBE
峰值回流温度（摄氏度）：260电源：5 V
最大电源电流（ICC）：38 mAProp。Delay @ Nom-Sup：6 ns
传播延迟（tpd）：6.2 ns认证状态：Not Qualified
座面最大高度：2.65 mm子类别：Bus Driver/Transceivers
最大供电电压 (Vsup)：5.5 V最小供电电压 (Vsup)：4.5 V
标称供电电压 (Vsup)：5 V表面贴装：YES
技术：BICMOS温度等级：INDUSTRIAL
端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)端子形式：GULL WING
端子节距：1.27 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED翻译：N/A
触发器类型：POSITIVE EDGE宽度：7.5 mm
Base Number Matches：1

SN74ABT8652DW 数据手册

 浏览型号SN74ABT8652DW的Datasheet PDF文件第2页浏览型号SN74ABT8652DW的Datasheet PDF文件第3页浏览型号SN74ABT8652DW的Datasheet PDF文件第4页浏览型号SN74ABT8652DW的Datasheet PDF文件第5页浏览型号SN74ABT8652DW的Datasheet PDF文件第6页浏览型号SN74ABT8652DW的Datasheet PDF文件第7页 
SN54ABT8652, SN74ABT8652  
SCAN TEST DEVICES  
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS  
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996  
SN54ABT8652 . . . JT PACKAGE  
SN74ABT8652 . . . DL OR DW PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
CLKAB  
SAB  
OEAB  
A1  
A2  
A3  
GND  
A4  
A5  
1
2
3
4
5
6
7
8
9
28 CLKBA  
27 SBA  
26 OEBA  
25 B1  
Functionally Equivalent to ’F652 and  
’ABT652 in the Normal-Function Mode  
SCOPE Instruction Set  
24 B2  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP,  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
With Masking Option  
– Pseudo-Random Pattern Generation  
From Outputs  
– Sample Inputs/Toggle Outputs  
– Binary Count From Outputs  
– Even-Parity Opcodes  
23 B3  
22 B4  
21  
V
CC  
20 B5  
19 B6  
18 B7  
17 B8  
16 TDI  
15 TCK  
A6 10  
A7 11  
A8 12  
TDO 13  
TMS 14  
Two Boundary-Scan Cells Per I/O for  
Greater Flexibility  
SN54ABT8652 . . . FK PACKAGE  
(TOP VIEW)  
State-of-the-Art EPIC-ΙΙB BiCMOS Design  
Significantly Reduces Power Dissipation  
Package Options Include Shrink  
Small-Outline (DL) and Plastic  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Ceramic  
DIPs (JT)  
4
3
2 1 28 27 26  
5
25  
24  
23  
22  
21  
20  
19  
OEBA  
SBA  
B7  
6
B8  
7
CLKBA  
CLKAB  
SAB  
TDI  
TCK  
TMS  
TDO  
A8  
8
9
description  
10  
11  
OEAB  
A1  
The ’ABT8652 scan test devices with octal bus  
transceivers and registers are members of the  
12 13 14 15 16 17 18  
Texas  
Instruments  
SCOPE  
testability  
integrated-circuit family. This family of devices  
supports IEEE Standard 1149.1-1990 boundary  
scan to facilitate testing of complex circuit-board  
assemblies. Scan access to the test circuitry is  
accomplished via the 4-wire test access port  
(TAP) interface.  
In the normal mode, these devices are functionally equivalent to the ’F652 and ’ABT652 octal bus transceivers  
and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing  
at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does  
not affect the functional operation of the SCOPE octal bus transceivers and registers.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...25

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SN74ABT8652DW 替代型号

型号 品牌 替代类型 描述 数据表
SN74ABT8652DWRG4 TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DWRE4 TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DWR TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

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