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SN74ABT8952DWRG4

更新时间： 2024-11-25 05:18:03
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器触发器逻辑集成电路测试光电二极管输出元件信息通信管理
页数 文件大小 规格书
29页 529K
描述
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

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中文翻译

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SN74ABT8952DWRG4 技术参数

是否无铅：不含铅是否Rohs认证：符合
生命周期：Obsolete零件包装代码：SOIC
包装说明：GREEN, PLASTIC, SO-28针数：28
Reach Compliance Code：unknownHTS代码：8542.39.00.01
风险等级：5.82Is Samacsys：N
其他特性：WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE控制类型：INDEPENDENT CONTROL
计数方向：BIDIRECTIONAL系列：ABT
JESD-30 代码：R-PDSO-G28JESD-609代码：e4
长度：17.9 mm负载电容（CL）：50 pF
逻辑集成电路类型：BOUNDARY SCAN REG BUS TRANSCEIVER最大I（ol）：0.064 A
湿度敏感等级：1位数：8
功能数量：1端口数量：2
端子数量：28最高工作温度：85 °C
最低工作温度：-40 °C输出特性：3-STATE
输出极性：TRUE封装主体材料：PLASTIC/EPOXY
封装代码：SOP封装等效代码：SOP28,.4
封装形状：RECTANGULAR封装形式：SMALL OUTLINE
包装方法：TAPE AND REEL峰值回流温度（摄氏度）：260
电源：5 V最大电源电流（ICC）：38 mA
Prop。Delay @ Nom-Sup：6.3 ns传播延迟（tpd）：5.3 ns
认证状态：Not Qualified座面最大高度：2.65 mm
子类别：Bus Driver/Transceivers最大供电电压 (Vsup)：5.5 V
最小供电电压 (Vsup)：4.5 V标称供电电压 (Vsup)：5 V
表面贴装：YES技术：BICMOS
温度等级：INDUSTRIAL端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式：GULL WING端子节距：1.27 mm
端子位置：DUAL处于峰值回流温度下的最长时间：NOT SPECIFIED
翻译：N/A触发器类型：POSITIVE EDGE
宽度：7.5 mmBase Number Matches：1

SN74ABT8952DWRG4 数据手册

 浏览型号SN74ABT8952DWRG4的Datasheet PDF文件第2页浏览型号SN74ABT8952DWRG4的Datasheet PDF文件第3页浏览型号SN74ABT8952DWRG4的Datasheet PDF文件第4页浏览型号SN74ABT8952DWRG4的Datasheet PDF文件第5页浏览型号SN74ABT8952DWRG4的Datasheet PDF文件第6页浏览型号SN74ABT8952DWRG4的Datasheet PDF文件第7页 
SN54ABT8952, SN74ABT8952  
SCAN TEST DEVICES WITH  
OCTAL REGISTERED BUS TRANSCEIVERS  
SCBS121D – AUGUST 1992 – REVISED JULY 1996  
SN54ABT8952 . . . JT PACKAGE  
SN74ABT8952 . . . DL OR DW PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
CLKAB  
CLKENAB  
OEAB  
A1  
CLKBA  
CLKENBA  
OEBA  
B1  
B2  
B3  
1
2
3
4
5
6
7
8
9
28  
27  
26  
25  
24  
23  
22  
21  
20  
Functionally Equivalent to ’BCT2952 and  
’ABT2952 in the Normal-Function Mode  
SCOPE Instruction Set  
A2  
A3  
GND  
A4  
A5  
IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP, and  
HIGHZ  
B4  
V
CC  
B5  
Parallel-Signature Analysis at Inputs With  
Masking Option  
A6 10  
19 B6  
A7  
A8  
B7  
B8  
11  
12  
18  
17  
Pseudo-Random Pattern Generation From  
Outputs  
TDO 13  
TMS 14  
16 TDI  
Sample Inputs/Toggle Outputs  
Binary Count From Outputs  
Even-Parity Opcodes  
15 TCK  
SN54ABT8952 . . . FK PACKAGE  
(TOP VIEW)  
Two Boundary-Scan Cells Per I/O for  
Greater Flexibility  
State-of-the-Art EPIC-ΙΙB BiCMOS Design  
Significantly Reduces Power Dissipation  
4
3
2 1 28 27 26  
5
25  
24  
23  
22  
21  
20  
19  
B7  
B8  
Package Options Include Shrink  
Small-Outline (DL) and Plastic  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Ceramic  
DIPs (JT)  
OEBA  
CLKENBA  
CLKBA  
CLKAB  
CLKENAB  
OEAB  
6
7
TDI  
TCK  
TMS  
TDO  
A8  
8
9
10  
11  
description  
A1  
12 13 14 15 16 17 18  
The ’ABT8952 scan test devices with octal  
registered bus transceivers are members of the  
Texas Instruments SCOPE testability integra-  
ted-circuit family. This family of devices supports  
IEEE Standard 1149.1-1990 boundary scan to  
facilitate testing of complex circuit-board assem-  
blies. Scan access to the test circuitry is  
accomplished via the 4-wire test access port  
(TAP) interface.  
In the normal mode, these devices are functionally equivalent to the ’BCT2952 and ’ABT2952 octal registered  
bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing  
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does  
not affect the functional operation of the SCOPE octal registered bus transceivers.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
UNLESS OTHERWISE NOTED this document contains PRODUCTION  
DATA information current as of publication date. Products conform to  
specifications per the terms of Texas Instruments standard warranty.  
Production processing does not necessarily include testing of all  
parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...29

中文翻译

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SN74ABT8952DWRG4 替代型号

型号 品牌 替代类型 描述 数据表
SN74ABT8952DWR TI

完全替代

 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN74ABT8952DWE4 TI

完全替代

 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN74ABT8952DW TI

完全替代

 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

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