SN65HVD1050-EP
www.ti.com
SLLS772A –DECEMBER 2006–REVISED OCTOBER 2009
EMC OPTIMIZED CAN TRANSCEIVER
Check for Samples :SN65HVD1050-EP
1
FEATURES
D PACKAGE
(TOP VIEW)
2
•
Controlled Baseline
One Assembly/Test Site, One Fabrication
Site
–
TXD
GND
VCC
S
1
2
3
4
8
7
6
5
CANH
CANL
Vref
•
Enhanced Diminishing Manufacturing Sources
(DMS) Support
RXD
•
•
•
•
•
•
Enhanced Product-Change Notification
(1)
Qualification Pedigree
DESCRIPTION/
Improved Replacement for the TJA1050
High Electromagnetic Immunity (EMI)
Very Low Electromagnetic Emissions (EME)
ORDERING INFORMATION
The SN65HVD1050 meets or exceeds the
specifications of the ISO 11898 standard for use in
applications employing a controller area network
(CAN). The device is also qualified for use in
Meets or Exceeds the Requirements of
ISO 11898-2
•
•
•
•
Bus-Fault Protection of –27 V to 40 V
Dominant Time-Out Function
automotive
applications
in
accordance
with
AEC-Q100.(2)
Thermal Shutdown Protection
As a CAN transceiver, this device provides differential
transmit capability to the bus and differential receive
capability to a CAN controller at signaling rates up to
1 megabit per second (Mbps)(3).
Power-Up/Down Glitch-Free Bus Inputs and
Outputs
–
–
High Input Impedance With Low VCC
Designed for operation in especially harsh
Monotonic Outputs During Power Cycling
environments,
the
SN65HVD1050
features
cross-wire, overvoltage, and loss of ground protection
from –27 V to 40 V, overtemperature protection, a
–12-V to 12-V common-mode range, and withstands
voltage transients from –200 V to 200 V, according to
ISO 7637.
APPLICATIONS
•
Industrial Automation
–
DeviceNET™ Data Buses (Vendor ID #806)
•
SAE J2284 High-Speed CAN for Automotive
Applications
Pin 8 provides for two different modes of operation:
high-speed or silent mode. The high-speed mode of
operation is selected by connecting S (pin 8) to
ground.
•
•
•
SAE J1939 Standard Data Bus Interface
ISO 11783 Standard Data Bus Interface
NMEA 2000 Standard Data Bus Interface
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
(2) The device is available with Q100 qualification as the
SN65HVD1050Q (Product Preview).
(3) The signaling rate of a line is the number of voltage
transitions that are made, per second, expressed in the units
bps (bits per second).
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
blk
blk
ORDERING INFORMATION
PART NUMBER
PACKAGE
MARKED AS
ORDERING NUMBER
SN65HVD1050M
SOIC-8
1050EP
SN65HVD1050MDREP (reel)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
DeviceNET is a trademark of Open Devicenet Vendors Association, Inc.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2009, Texas Instruments Incorporated
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