SM470R1B1M-HT
www.ti.com
SPNS155D –SEPTEMBER 2009–REVISED JUNE 2011
16/32-BIT RISC FLASH MICROCONTROLLER
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Asynchronous/Isosynchronous Modes
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FEATURES
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Two High-End CAN Controllers (HECC)
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High-Performance Static CMOS Technology
SM470R1x 16/32-Bit RISC Core ( ARM7TDMI™)
32-Mailbox Capacity
Fully Compliant With CAN Protocol,
Version 2.0B
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60-MHz System Clock (Pipeline Mode)
Independent 16/32-Bit Instruction Set
Open Architecture With Third-Party Support
Built-In Debug Module
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Five Inter-Integrated Circuit (I2C) Modules
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Multi-Master and Slave Interfaces
Up to 400 Kbps (Fast Mode)
7- and 10-Bit Address Capability
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Integrated Memory
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1M-Byte Program Flash
Two Banks With 16 Contiguous Sectors
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High-End Timer Lite (HET)
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12 Programmable I/O Channels:
12 High-Resolution Pins
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64K-Byte Static RAM (SRAM)
Memory Security Module (MSM)
JTAG Security Module
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High-Resolution Share Feature (XOR)
High-End Timer RAM
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Operating Features
64-Instruction Capacity
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Low-Power Modes: STANDBY and HALT
Industrial Temperature Range
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External Clock Prescale (ECP) Module
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Programmable Low-Frequency External
Clock (CLK)
12-Channel, 10-Bit Multi-Buffered ADC
(MibADC)
470+ System Module
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32-Bit Address Space Decoding
Bus Supervision for Memory/Peripherals
Digital Watchdog (DWD) Timer
Analog Watchdog (AWD) Timer
Enhanced Real-Time Interrupt (RTI)
Interrupt Expansion Module (IEM)
System Integrity and Failure Detection
ICE Breaker
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64-Word FIFO Buffer
Single- or Continuous-Conversion Modes
1.55-µs Minimum Sample and Conversion
Time
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Calibration Mode and Self-Test Features
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Flexible Interrupt Handling
Expansion Bus Module (EBM)
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Direct Memory Access (DMA) Controller
32 Control Packets and 16 Channels
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Supports 8- and 16-Bit Expansion Bus
Memory Interface Mappings
42 I/O Expansion Bus Pins
Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock Module With Prescaler
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Multiply-by-4 or -8 Internal ZPLL Option
ZPLL Bypass Mode
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46 Dedicated General-Purpose I/O (GIO) Pins
and 47 Additional Peripheral I/Os
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Sixteen External Interrupts
On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1 (1) (JTAG) Test-Access Port
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Twelve Communication Interfaces:
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Two Serial Peripheral Interfaces (SPIs)
255 Programmable Baud Rates
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Available in KGD and HFQ Packages
Three Serial Communication Interfaces
(SCIs)
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224 Selectable Baud Rates
(1) The test-access port is compatible with the IEEE Standard
1149.1-1990, IEEE Standard Test-Access Port and Boundary
Scan Architecture specification. Boundary scan is not
supported on this device.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
ARM7TDMI is a trademark of Advanced RISC Machines Limited (ARM).
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2011, Texas Instruments Incorporated