RU1Z150S
Electrical Characteristics (TC=25°C Unless Otherwise Noted)
RU1Z150S
Symbol
Parameter
Test Condition
Unit
Min.
Typ.
Max.
Static Characteristics
VGS=0V, IDS=250µA
VDS=150V, VGS=0V
BVDSS
IDSS
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
150
V
1
30
µA
TJ=125°C
VDS=VGS, IDS=250µA
VGS=±25V, VDS=0V
VGS=10V, IDS=75A
VGS(th)
IGSS
Gate Threshold Voltage
2.5
4.5
±100
12
V
Gate Leakage Current
nA
mΩ
④
RDS(ON)
Drain-Source On-state Resistance
8.8
Diode Characteristics
④
VSD
ISD=75A, VGS=0V
Diode Forward Voltage
1.2
V
trr
Reverse Recovery Time
55
ns
nC
ISD=75A, dlSD/dt=100A/µs
Qrr
Reverse Recovery Charge
105
⑤
Dynamic Characteristics
VGS=0V,VDS=0V,F=1MHz
RG
Ciss
Coss
Crss
td(ON)
tr
Gate Resistance
1.5
8200
1050
615
37
Ω
VGS=0V,
VDS=75V,
Frequency=1.0MHz
Input Capacitance
pF
Output Capacitance
Reverse Transfer Capacitance
Turn-on Delay Time
Turn-on Rise Time
123
190
67
VDD=75V,IDS=75A,
VGEN=10V,RG=25Ω
ns
td(OFF)
tf
Turn-off Delay Time
Turn-off Fall Time
⑤
Gate Charge Characteristics
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
247
19
VDS=120V, VGS=10V,
IDS=75A
nC
168
①Pulse width limited by safe operating area.
Notes:
②Calculated continuous current based on maximum allowable junction temperature. The package
limitation current is 75A.
③Limited by TJmax, IAS =53A, VDD = 48V, RG = 47Ω , Starting TJ = 25°C.
④Pulse test;Pulse width≤300µs, duty cycle≤2%.
⑤Guaranteed by design, not subject to production testing.
Ruichips Semiconductor Co., Ltd
Rev. B– MAY., 2016
2
www.ruichips.com