RFM products are now
Murata products.
RO3302A
• Very Low Series Resistance
• Quartz Stability
• Surface-mount Ceramic Case
• Complies with Directive 2002/95/EC (RoHS)
The RO3302A is a one-port surface-acoustic-wave (SAW) resonator packaged in a surface-mount ceramic
case. It provides reliable, fundamental-mode quartz frequency stabilization of fixed-frequency transmitters
operating at 361.3 MHz.
Pb
361.3 MHz
SAW Resonator
Absolute Maximum Ratings
Rating
Value
+0
Units
dBm
VDC
°C
CW RF Power Dissipation (See: Typical Test Circuit)
DC Voltage Between Terminals (observe ESD precautions)
Case Temperature
±30
-40 to +85
260
SM5035-4
Soldering Temperature (10 seconds / 5 cycles maximum)
°C
Electrical Characteristics
Characteristic
Sym
Notes
2,3,4,5
2,5,6
Minimum
Typical
Maximum
361.400
±100
Units
MHz
kHz
fC
ΔfC
IL
Center Frequency (+25 °C)
Absolute Frequency
361.200
Tolerance from 361.3 MHz
Insertion Loss
Quality Factor
1.7
17100
3036
25
2.0
dB
QU
QL
TO
fO
Unloaded Q
5,6,7
50 Ω Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
10
40
°C
fC
6,7,8
ppm/°C2
ppm/yr
Frequency Temperature Coefficient
Absolute Value during the First Year
FTC
|fA|
0.032
≤10
Frequency Aging
1
5
DC Insulation Resistance between Any Two Terminals
1.0
MΩ
Ω
RM
LM
RF Equivalent RLC Model
Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
21.6
163
1.19
1.5
5, 7, 9
µH
fF
CM
CO
5, 6, 9
2, 7
pF
nH
LTEST
Test Fixture Shunt Inductance
129
Lid Symbolization (in addition to Lot and/or Date Codes)
867 // YYWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
NOTES:
1.
2.
Frequency aging is the change in f with time and is specified at +65 °C or
subject to change without notice.
C
7.
8.
Derived mathematically from one or more of the following directly
measured parameters: f , IL, 3 dB bandwidth, f versus T , and C .
less. Aging may exceed the specification for prolonged temperatures
above +65 °C. Typically, aging is greatest the first year after manufacture,
decreasing in subsequent years.
C
C
C
O
Turnover temperature, T , is the temperature of maximum (or turnover)
O
The center frequency, f , is measured at the minimum insertion loss point,
frequency, f . The nominal frequency at any case temperature, T , may be
C
O
C
IL , with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The
2
MIN
calculated from: f = f [1 - FTC (T -T ) ]. Typically oscillator T is
O
O
C
O
shunt inductance, L
, is tuned for parallel resonance with C at f .
TEST
O C
approximately equal to the specified resonator T .
This equivalent RLC model approximates resonator performance near the
resonant frequency and is provided for reference only. The capacitance C
is the static (nonmotional) capacitance between the two terminals
measured at low frequency (10 MHz) with a capacitance meter. The
O
Typically, f
or f
is approximately equal to the
OSCILLATOR
TRANSMITTER
9.
resonator f .
C
O
3.
4.
One or more of the following United States patents apply: 4,454,488 and
4,616,197.
Typically, equipment utilizing this device requires emissions testing and
government approval, which is the responsibility of the equipment
manufacturer.
measurement includes parasitic capacitance with "NC” pads unconnected.
Case parasitic capacitance is approximately 0.05 pF. Transducer parallel
capacitance can by calculated as: C ≈ C - 0.05 pF.
P
O
5.
6.
Unless noted otherwise, case temperature T = +25 ±2 °C.
C
10. Tape and Reel standard per ANSI / EIA 481.
The design, manufacturing process, and specifications of this device are
©2010-2015 by Murata Electronics N.A., Inc.
RO3302A (R) 2/11/15
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