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RN2325A PDF预览

RN2325A

更新时间: 2024-11-24 03:36:23
品牌 Logo 应用领域
东芝 - TOSHIBA 开关驱动PC
页数 文件大小 规格书
11页 207K
描述
Silicon PNP Epitaxial Type (PCT Process) Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications

RN2325A 数据手册

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RN2321ARN2327A  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)  
RN2321A,RN2322A,RN2323A,RN2324A  
RN2325A,RN2326A,RN2327A  
Switching, Inverter Circuit, Interface Circuit  
And Driver Circuit Applications  
Unit in mm  
z High current driving is possible.  
z Since bias resisters are built in the transistor, the miniaturization of the  
apparatus by curtailment of the number of parts and laborsaving of an  
assembly are possible.  
z Many kinds of resistance value are lined up in order to support various  
kinds of circuit design.  
z Complementary to RN1321A~RN1327A  
z Low V  
enable to be low power dissipation on high current driving.  
CE(sat)  
Equivalent Circuit And Bias Resistance Values  
Type No.  
R1 (kΩ)  
R2 (kΩ)  
1.BASE  
2.EMITTER  
3.COLLECTOR  
RN2321A  
RN2322A  
RN2323A  
RN2324A  
RN2325A  
RN2326A  
RN2327A  
1
2.2  
4.7  
10  
1
2.2  
4.7  
10  
10  
10  
10  
JEDEC  
JEITA  
SC-70  
2-2E1A  
0.47  
1
TOSHIBA  
Weight: 0.006 g (typ.)  
2.2  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Collector-base voltage  
V
V
15  
12  
V
V
CBO  
CEO  
RN2321A~2327A  
Collector-emitter voltage  
Emitter-base voltage  
RN2321A~2324A  
RN2325A, 2326A  
RN2327A  
10  
V
V
5  
EBO  
6  
Collector current  
I
500  
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN2321A~2327A  
T
150  
j
T
stg  
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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